Ion migration in p-type perovskite MAPbI3 films under an electric field and thin-film transistor device failure

Jiale Su1, Zhenxin Yang1, Xuanhe Li1

  • 1Key Laboratory of Yunnan Provincial Higher Education Institutions for Optoelectronics Device Engineering, School of Physics and Astronomy, Yunnan University, Kunming 650504, China. qiangzhu@ynu.edu.cn.

Chemical Communications (Cambridge, England)
|September 11, 2024
PubMed