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Ultra-fast Digital DPC Yielding High Spatio-temporal Resolution for Low-Dose Phase Characterization.

Julie Marie Bekkevold1,2, Jonathan J P Peters1,2, Ryo Ishikawa3

  • 1School of Physics, Trinity College Dublin, College Green, Dublin D02 PN40, Ireland.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 13, 2024
PubMed
Summary
This summary is machine-generated.

High-fidelity differential phase contrast (DPC) phase reconstruction is now achievable from segmented detectors in scanning transmission electron microscopy. This advancement overcomes data challenges, enabling faster imaging for in situ experiments.

Keywords:
4D-STEMdifferential phase contrasthigh-speed imaginglow dosescanning transmission electron microscopy (STEM)

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Area of Science:

  • Materials Science
  • Physics
  • Electron Microscopy

Background:

  • Scanning transmission electron microscopy (STEM) is increasingly used for phase imaging of beam-sensitive materials and in situ experiments.
  • Advancements in 4D-STEM detectors improve temporal resolution for differential phase contrast (DPC) and ptychography.
  • Data handling challenges from large datasets and detector readout burden limit practical adoption and temporal resolution.

Purpose of the Study:

  • To develop a method for high-fidelity DPC phase reconstruction using annular segmented detectors.
  • To overcome the limitations of conventional analog data processing in high-speed STEM.
  • To enable low-dose phase imaging for in situ experiments with improved temporal resolution.

Main Methods:

  • Integration of ultra-fast scan coils with detector signal digitization.
  • Utilizing an annular segmented detector for DPC data acquisition.
  • Employing dose fractionation through fast scanning and multi-framing for post-processing.

Main Results:

  • Demonstrated high-fidelity DPC phase reconstruction from digitized annular segmented detector data.
  • Achieved reliable data acquisition even at the fastest scan speeds, surpassing conventional methods.
  • Showcased the ability to balance signal-to-noise ratio and temporal resolution via post-processing binning.

Conclusions:

  • Digitized DPC-segment image processing offers a robust alternative to analog methods for high-speed STEM.
  • The developed technique facilitates low-dose, high-temporal-resolution phase imaging for in situ studies.
  • This approach enhances the practical utility of advanced STEM techniques for materials characterization.