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Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior

Gert Rietveld1, Jan H N van der Beek1, Marlin Kraft2

  • 1Van Swinden Laboratorium, the National Metrology Institute of The Netherlands, 2600 AR Delft, The Netherlands.

IEEE Transactions on Instrumentation and Measurement
|October 24, 2024
PubMed
Abstract

Keywords:
Comparisonlow-ohmic measurementsprecision measurementsresistance measurementsresistorsshuntstraveling behavior

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