Related Experiment Video
Updated: Jan 9, 2026

10:25
Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
10.5K
Correction to "Bis-PCBM-Containing Electrically Conducting Electron-Beam Resist for Nanometer-Scale Organic Devices"
Abstract:
[This corrects the article DOI: 10.1021/acsaelm.4c02325.].

