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GIWAXS using microbeam applied in halide perovskite films for high spectral resolution and mapping capability
Meirong Fu1,2,3, Bingchen He1, Liujiang Zhang4
1Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, People's Republic of China.
Journal of Synchrotron Radiation
|May 21, 2026
Summary
Microbeam grazing-incidence wide-angle X-ray scattering (µ-GIWAXS) overcomes limitations of standard GIWAXS, offering improved spectral resolution and accuracy. This advanced technique enables detailed microstructural analysis of perovskite films for scalable optoelectronic applications.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Synchrotron-based grazing-incidence wide-angle X-ray scattering (GIWAXS) is crucial for analyzing halide perovskite films.
- Standard GIWAXS with large X-ray beams (100 µm) faces challenges like footprint effects, causing peak broadening and spectral distortions.
Purpose of the Study:
- To demonstrate the effectiveness of microbeam GIWAXS (µ-GIWAXS) in mitigating footprint effects.
- To enhance spectral resolution and accuracy in perovskite film microstructure analysis.
- To optimize µ-GIWAXS data acquisition and evaluate its impact on perovskite structural stability.
Main Methods:
- Utilized microbeam GIWAXS (µ-GIWAXS) with smaller X-ray beams to reduce footprint effects.
- Systematically varied grazing incidence angles to quantify footprint length contributions to peak broadening.
- Implemented beam-direction-perpendicular fly scanning for optimized data acquisition and radiation damage minimization.
- Conducted extended exposure experiments to assess the structural stability of perovskite films under µ-GIWAXS irradiation.
Main Results:
- µ-GIWAXS significantly mitigates footprint effects, leading to enhanced spectral resolution and accuracy compared to standard GIWAXS.
- Quantified the relationship between footprint length and diffraction peak broadening.
- Optimized scanning strategy improved data quality and reduced radiation damage.
- Evaluated the structural integrity of perovskite films under prolonged µ-GIWAXS exposure.
- µ-GIWAXS successfully mapped key microstructural properties like crystallinity, orientation, PbI2 concentration, and lattice strain.
Conclusions:
- µ-GIWAXS offers superior spectral resolution and accuracy for perovskite film analysis.
- The technique enables spatially resolved mapping of critical microstructural characteristics, addressing inhomogeneity in large-area devices.
- µ-GIWAXS is a promising tool for advancing scalable perovskite optoelectronics due to its analytical capabilities and reduced artifacts.
