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Computer networked scanning electron microscope for teaching, research, and industry applications
L S Chumbley1, M Meyer, K Fredrickson
1Department of Materials Science and Engineering, Iowa State University 50011, USA.
Microscopy Research and Technique
|November 1, 1995
Summary
A new remote-access laboratory enables students to learn scanning electron microscope (SEM) operation via the internet. This flexible, inexpensive system offers broad applications for education, research, and industry.
Area of Science:
- Materials Science
- Engineering Education
Background:
- Traditional scanning electron microscope (SEM) training requires dedicated, on-site access.
- Limited availability and high costs of SEMs can hinder widespread educational use.
Purpose of the Study:
- To develop an accessible and cost-effective laboratory for teaching SEM operation.
- To enable remote learning and operation of SEMs using standard computer technology.
Main Methods:
- A computer network facilitates remote SEM operation.
- Movable teaching stations with computer, monitor, and joystick allow control of SEM parameters and image acquisition.
- Internet connectivity enables access from any location.
Main Results:
- Students can view SEM images, manipulate samples, control microscope parameters, and acquire X-ray spectra remotely.
- Images can be stored for analysis and reporting.
- The system is flexible, inexpensive, and utilizes nonproprietary technology.
Conclusions:
- The developed remote-access SEM laboratory effectively facilitates student training.
- The multiuser, inexpensive, and easily installable concept has potential for industrial and research applications beyond education.