Showing results (1-10 of 564) with videos related to
Sort By:
Pageof 57
Applied Optics|June 12, 2010
Anomalies in integrating sphere measurements on structured samplesA Roos, C G Ribbing, M BergkvistApplied Optics|June 12, 2010
Determination of the SiO(2)/Si interface roughness by diffuse reflectance measurementsA Roos, M Bergkvist, C G RibbingApplied Optics|June 16, 2010
Optical scattering from oxidized metals. 1: Model formulation and propertiesA Roos, M Bergkvist, C G RibbingApplied Optics|June 18, 2010
Optical scattering from oxidized metals. 1: Model formulation and properties; errataA Roos, M Bergkvist, C G RibbingApplied Optics|June 12, 2010
Determination of the SiO(2)/Si interface roughness by diffuse reflectance measurementsA Roos, M Bergkvist, C G RibbingApplied Optics|September 11, 2010
Determination of interface roughness by using a spectroscopic total-integrated-scatter instrumentD Rönnow, M Bergkvist, A Roos, et al.Applied Optics|June 18, 2010
Optical scattering from oxidized metals. 2: Model verification for oxidized copperM Bergkvist, A Roos, C G Ribbing, et al.Applied Optics|June 12, 2010
Interpretation of integrating sphere signal output for non-Lambertian samplesA Roos, C G RibbingApplied Optics|September 22, 2010
Reststrahlen material bilayers: an option for tailoring in the infraredC G RibbingApplied Optics|October 22, 2010
Infrared optical constants of polycrystalline boron nitride: commentC G RibbingPageof 57