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Ultramicroscopy|September 23, 2011
The effect of vacancies on the annular dark field image contrast of grain boundaries: a SrTiO(3) case studyH-S Lee, S D Findlay, T Mizoguchi, et al.Journal of Microscopy|February 19, 2026
A Bayesian approach to spectroscopic depth sectioning for locating dopant atomsMichael Deimetry, Timothy C Petersen, Matthew Weyland, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 16, 2025
Dopant Site Occupancy Determined by Core-Loss-Filtered, Position-Averaged Convergent Beam Electron DiffractionMichael Deimetry, Timothy C Petersen, Matthew Weyland, et al.Ultramicroscopy|December 4, 2014
Modelling the inelastic scattering of fast electronsL J Allen, A J D Alfonso, S D FindlayUltramicroscopy|July 25, 2016
Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probesD J Taplin, N Shibata, M Weyland, et al.Nano Letters|October 16, 2010
Standardless atom counting in scanning transmission electron microscopyJames M LeBeau, Scott D Findlay, Leslie J Allen, et al.Acta Neuropsychiatrica|March 18, 2016
Recognition memory abnormalities in asymptomatic biological parents of a patient with schizophreniaN M J Edelstyn, J Drakeford, F Oyebode, et al.Nature|February 10, 2022
Real-space visualization of intrinsic magnetic fields of an antiferromagnetYuji Kohno, Takehito Seki, Scott D Findlay, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2020
Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast ImagingBudhika G Mendis, Juri Barthel, Scott D Findlay, et al.Ultramicroscopy|November 27, 2009
Position averaged convergent beam electron diffraction: theory and applicationsJames M Lebeau, Scott D Findlay, Leslie J Allen, et al.Pageof 19