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Brent A Sperling

Showing results (1-10 of 15) with videos related to

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Applied Spectroscopy|May 15, 2018
Evaluation of Silicon Wafer-Based Internal Reflection Elements for Use with in Situ Fourier Transform Infrared (FT-IR) SpectroscopyBrent A Sperling, Berc Kalanyan
Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B|March 5, 2020
Experiment-based modelling of a vapor draw ampoule used for low-volatility precursorsBrent A Sperling, James E Maslar
Applied Spectroscopy|March 28, 2012
Quantum cascade laser-based measurement of metal alkylamide density during atomic layer depositionJames E Maslar, William A Kimes, Brent A Sperling
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
Apparatus for Characterizing Gas-Phase Chemical Precursor Delivery for Thin Film Deposition ProcessesJames E Maslar, William A Kimes, Brent A Sperling
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|March 20, 2020
<i>In situ</i> infrared spectroscopy during La<sub>2</sub>O<sub>3</sub> ALD using La( <sup><i>i</i></sup> PrCp)<sub>3</sub> and H<sub>2</sub>OBrent A Sperling, James E Maslar, Sergei V Ivanov
Journal of Electronic Materials|December 19, 2024
Band Offset and Electron Affinity of Monolayer MoSe<sub>2</sub> by Internal PhotoemissionQin Zhang, Siyuan Zhang, Brent A Sperling, et al.
Applied Spectroscopy|February 10, 2015
Measurements of metal alkylamide density during atomic layer deposition using a mid-infrared light-emitting diode (LED) sourceJames E Maslar, John Hoang, William A Kimes, et al.
Applied Spectroscopy|September 27, 2013
Time-resolved surface infrared spectroscopy during atomic layer depositionBrent A Sperling, John Hoang, William A Kimes, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|July 10, 2024
Characterization of bubbler performance for low-volatility liquid precursor deliveryJames E Maslar, William A Kimes, Brent A Sperling, et al.
Applied Spectroscopy|July 15, 2017
Nondispersive Infrared Gas Analyzer for Vapor Density Measurements of a Carbonyl-Containing Organometallic Cobalt PrecursorJames E Maslar, William A Kimes, Brent A Sperling, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Applied Spectroscopy|May 15, 2018
Evaluation of Silicon Wafer-Based Internal Reflection Elements for Use with in Situ Fourier Transform Infrared (FT-IR) SpectroscopyBrent A Sperling, Berc Kalanyan
Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B|March 5, 2020
Experiment-based modelling of a vapor draw ampoule used for low-volatility precursorsBrent A Sperling, James E Maslar
Applied Spectroscopy|March 28, 2012
Quantum cascade laser-based measurement of metal alkylamide density during atomic layer depositionJames E Maslar, William A Kimes, Brent A Sperling
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
Apparatus for Characterizing Gas-Phase Chemical Precursor Delivery for Thin Film Deposition ProcessesJames E Maslar, William A Kimes, Brent A Sperling
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|March 20, 2020
<i>In situ</i> infrared spectroscopy during La<sub>2</sub>O<sub>3</sub> ALD using La( <sup><i>i</i></sup> PrCp)<sub>3</sub> and H<sub>2</sub>OBrent A Sperling, James E Maslar, Sergei V Ivanov
Journal of Electronic Materials|December 19, 2024
Band Offset and Electron Affinity of Monolayer MoSe<sub>2</sub> by Internal PhotoemissionQin Zhang, Siyuan Zhang, Brent A Sperling, et al.
Applied Spectroscopy|February 10, 2015
Measurements of metal alkylamide density during atomic layer deposition using a mid-infrared light-emitting diode (LED) sourceJames E Maslar, John Hoang, William A Kimes, et al.
Applied Spectroscopy|September 27, 2013
Time-resolved surface infrared spectroscopy during atomic layer depositionBrent A Sperling, John Hoang, William A Kimes, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|July 10, 2024
Characterization of bubbler performance for low-volatility liquid precursor deliveryJames E Maslar, William A Kimes, Brent A Sperling, et al.
Applied Spectroscopy|July 15, 2017
Nondispersive Infrared Gas Analyzer for Vapor Density Measurements of a Carbonyl-Containing Organometallic Cobalt PrecursorJames E Maslar, William A Kimes, Brent A Sperling, et al.
Pageof 2