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The British Journal of Psychiatry : the Journal of Mental Science
|
September 25, 1998
Systematic does not necessarily mean comprehensive
C E Adams, B Thornley, C Joy
Child Development
|
April 29, 2021
Academic Trajectories of Children in Formal and Informal Kinship Care
Tyreasa Washington, C Joy Stewart, Roderick A Rose
Scanning
|
May 17, 2012
Do SE(II) electrons really degrade SEM image quality?
Gary H Bernstein, Andrew D Carter, David C Joy
Journal of Microscopy
|
July 3, 2004
Experimental secondary electron spectra under SEM conditions
D C Joy, M S Prasad, H M Meyer
Journal of Electron Microscopy Technique
|
January 1, 1990
High resolution SE-I SEM study of enamel crystal morphology
R P Apkarian, M D Gutekunst, D C Joy
Scanning
|
November 1, 1996
Measuring the performance of scanning electron microscope detectors
D C Joy, C S Joy, R D Bunn
Journal of the California Dental Association
|
June 1, 1990
From recent grad to working professional
L Fasnacht, R Garland, J C Joy, et al.
Ultramicroscopy
|
January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devices
Alexander E Thesen, Bernhard G Frost, David C Joy
Nanotechnology
|
April 2, 2010
Monte Carlo simulation of focused helium ion beam induced deposition
Daryl A Smith, David C Joy, Philip D Rack
AJNR. American Journal of Neuroradiology
|
March 1, 1993
Scalloping deformity of the corpus callosum following ventricular shunting
Y Numaguchi, D A Kristt, C Joy, et al.
Page
of 11
Search research articles
Search
Showing results (31-40 of 102) with videos related to
Sort By:
Page
of 11
The British Journal of Psychiatry : the Journal of Mental Science
|
September 25, 1998
Systematic does not necessarily mean comprehensive
C E Adams, B Thornley, C Joy
Child Development
|
April 29, 2021
Academic Trajectories of Children in Formal and Informal Kinship Care
Tyreasa Washington, C Joy Stewart, Roderick A Rose
Scanning
|
May 17, 2012
Do SE(II) electrons really degrade SEM image quality?
Gary H Bernstein, Andrew D Carter, David C Joy
Journal of Microscopy
|
July 3, 2004
Experimental secondary electron spectra under SEM conditions
D C Joy, M S Prasad, H M Meyer
Journal of Electron Microscopy Technique
|
January 1, 1990
High resolution SE-I SEM study of enamel crystal morphology
R P Apkarian, M D Gutekunst, D C Joy
Scanning
|
November 1, 1996
Measuring the performance of scanning electron microscope detectors
D C Joy, C S Joy, R D Bunn
Journal of the California Dental Association
|
June 1, 1990
From recent grad to working professional
L Fasnacht, R Garland, J C Joy, et al.
Ultramicroscopy
|
January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devices
Alexander E Thesen, Bernhard G Frost, David C Joy
Nanotechnology
|
April 2, 2010
Monte Carlo simulation of focused helium ion beam induced deposition
Daryl A Smith, David C Joy, Philip D Rack
AJNR. American Journal of Neuroradiology
|
March 1, 1993
Scalloping deformity of the corpus callosum following ventricular shunting
Y Numaguchi, D A Kristt, C Joy, et al.
Page
of 11