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C Joy

Showing results (31-40 of 102) with videos related to

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The British Journal of Psychiatry : the Journal of Mental Science|September 25, 1998
Systematic does not necessarily mean comprehensiveC E Adams, B Thornley, C Joy
Child Development|April 29, 2021
Academic Trajectories of Children in Formal and Informal Kinship CareTyreasa Washington, C Joy Stewart, Roderick A Rose
Scanning|May 17, 2012
Do SE(II) electrons really degrade SEM image quality?Gary H Bernstein, Andrew D Carter, David C Joy
Journal of Microscopy|July 3, 2004
Experimental secondary electron spectra under SEM conditionsD C Joy, M S Prasad, H M Meyer
Journal of Electron Microscopy Technique|January 1, 1990
High resolution SE-I SEM study of enamel crystal morphologyR P Apkarian, M D Gutekunst, D C Joy
Scanning|November 1, 1996
Measuring the performance of scanning electron microscope detectorsD C Joy, C S Joy, R D Bunn
Journal of the California Dental Association|June 1, 1990
From recent grad to working professionalL Fasnacht, R Garland, J C Joy, et al.
Ultramicroscopy|January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devicesAlexander E Thesen, Bernhard G Frost, David C Joy
Nanotechnology|April 2, 2010
Monte Carlo simulation of focused helium ion beam induced depositionDaryl A Smith, David C Joy, Philip D Rack
AJNR. American Journal of Neuroradiology|March 1, 1993
Scalloping deformity of the corpus callosum following ventricular shuntingY Numaguchi, D A Kristt, C Joy, et al.
Pageof 11

Showing results (31-40 of 102) with videos related to

Sort By:
Pageof 11
The British Journal of Psychiatry : the Journal of Mental Science|September 25, 1998
Systematic does not necessarily mean comprehensiveC E Adams, B Thornley, C Joy
Child Development|April 29, 2021
Academic Trajectories of Children in Formal and Informal Kinship CareTyreasa Washington, C Joy Stewart, Roderick A Rose
Scanning|May 17, 2012
Do SE(II) electrons really degrade SEM image quality?Gary H Bernstein, Andrew D Carter, David C Joy
Journal of Microscopy|July 3, 2004
Experimental secondary electron spectra under SEM conditionsD C Joy, M S Prasad, H M Meyer
Journal of Electron Microscopy Technique|January 1, 1990
High resolution SE-I SEM study of enamel crystal morphologyR P Apkarian, M D Gutekunst, D C Joy
Scanning|November 1, 1996
Measuring the performance of scanning electron microscope detectorsD C Joy, C S Joy, R D Bunn
Journal of the California Dental Association|June 1, 1990
From recent grad to working professionalL Fasnacht, R Garland, J C Joy, et al.
Ultramicroscopy|January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devicesAlexander E Thesen, Bernhard G Frost, David C Joy
Nanotechnology|April 2, 2010
Monte Carlo simulation of focused helium ion beam induced depositionDaryl A Smith, David C Joy, Philip D Rack
AJNR. American Journal of Neuroradiology|March 1, 1993
Scalloping deformity of the corpus callosum following ventricular shuntingY Numaguchi, D A Kristt, C Joy, et al.
Pageof 11