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Christian Dwyer

Showing results (1-10 of 30) with videos related to

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Physical Review Letters|February 17, 2023
Quantum Limits of Transmission Electron MicroscopyChristian Dwyer
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|July 24, 2019
Inpainting vs denoising for dose reduction in scanning-beam microscopiesToby Sanders, Christian Dwyer
Ultramicroscopy|August 12, 2017
Subsampling and inpainting approaches for electron tomographyToby Sanders, Christian Dwyer
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 14, 2014
Quantitative position-averaged K-, L-, and M-shell core-loss scattering in STEMYe Zhu, Christian Dwyer
Ultramicroscopy|February 25, 2014
Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?Huolin L Xin, Christian Dwyer, David A Muller
Physical Review Letters|May 24, 2011
Imaging high-energy electrons propagating in a crystalJoanne Etheridge, Sorin Lazar, Christian Dwyer, et al.
Ultramicroscopy|November 26, 2013
Channelling contrast analysis of lattice images: conditions for probe-insensitive STEMChris J Rossouw, Christian Dwyer, Hadas Katz-Boon, et al.
Ultramicroscopy|November 13, 2012
Rapid measurement of nanoparticle thickness profilesHadas Katz-Boon, Chris J Rossouw, Christian Dwyer, et al.
Nanoscale Horizons|April 8, 2020
Size dependent surface reconstruction in detonation nanodiamondsShery L Y Chang, Christian Dwyer, Eiji Ōsawa, et al.
Nature Materials|September 1, 2015
Direct mapping of Li-enabled octahedral tilt ordering and associated strain in nanostructured perovskitesYe Zhu, Ray L Withers, Laure Bourgeois, et al.
Pageof 3

Showing results (1-10 of 30) with videos related to

Sort By:
Pageof 3
Physical Review Letters|February 17, 2023
Quantum Limits of Transmission Electron MicroscopyChristian Dwyer
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|July 24, 2019
Inpainting vs denoising for dose reduction in scanning-beam microscopiesToby Sanders, Christian Dwyer
Ultramicroscopy|August 12, 2017
Subsampling and inpainting approaches for electron tomographyToby Sanders, Christian Dwyer
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 14, 2014
Quantitative position-averaged K-, L-, and M-shell core-loss scattering in STEMYe Zhu, Christian Dwyer
Ultramicroscopy|February 25, 2014
Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?Huolin L Xin, Christian Dwyer, David A Muller
Physical Review Letters|May 24, 2011
Imaging high-energy electrons propagating in a crystalJoanne Etheridge, Sorin Lazar, Christian Dwyer, et al.
Ultramicroscopy|November 26, 2013
Channelling contrast analysis of lattice images: conditions for probe-insensitive STEMChris J Rossouw, Christian Dwyer, Hadas Katz-Boon, et al.
Ultramicroscopy|November 13, 2012
Rapid measurement of nanoparticle thickness profilesHadas Katz-Boon, Chris J Rossouw, Christian Dwyer, et al.
Nanoscale Horizons|April 8, 2020
Size dependent surface reconstruction in detonation nanodiamondsShery L Y Chang, Christian Dwyer, Eiji Ōsawa, et al.
Nature Materials|September 1, 2015
Direct mapping of Li-enabled octahedral tilt ordering and associated strain in nanostructured perovskitesYe Zhu, Ray L Withers, Laure Bourgeois, et al.
Pageof 3