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Journal of Research of the National Institute of Standards and Technology|July 23, 2016
X-Ray Microanalysis in the Variable Pressure (Environmental) Scanning Electron MicroscopeDale E NewburyScanning|August 7, 2007
Mistakes encountered during automatic peak identification in low beam energy X-ray microanalysisDale E NewburyMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
The new X-ray mapping: X-ray spectrum imaging above 100 kHz output count rate with the silicon drift detectorDale E NewburyScanning|July 31, 2004
Quantitative electron probe microanalysis of rough targets: testing the peak-to-local background methodDale E NewburyMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Electron-excited energy dispersive X-ray spectrometry at high speed and at high resolution: silicon drift detectors and microcalorimetersDale E NewburyMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Misidentification of major constituents by automatic qualitative energy dispersive X-ray microanalysis: a problem that threatens the credibility of the analytical communityDale E NewburyScanning|November 5, 2005
X-ray spectrometry and spectrum image mapping at output count rates above 100 kHz with a silicon drift detector on a scanning electron microscopeDale E NewburyMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Castaing's Electron Microprobe and Its Impact on Materials ScienceDale E. NewburyJournal of Research of the National Institute of Standards and Technology|July 23, 2016
Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron MicroscopyDale E NewburyMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 29, 2009
Assessing charging effects on spectral quality for X-ray microanalysis in low voltage and variable pressure/environmental scanning electron microscopyDale E NewburyPageof 4