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Assessing charging effects on spectral quality for X-ray microanalysis in low voltage and variable

Dale E Newbury1

  • 1National Institute of Standards and Technology, Gaithersburg, MD 20899-8371, USA. dale.newbury@nist.gov

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 29, 2009
PubMed

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