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David C Joy

Showing results (1-10 of 24) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Fundamental Constants for Quantitative X-ray MicroanalysisDavid C. Joy
Nature Materials|September 24, 2009
Scanning electron microscopy: Second best no moreDavid C Joy
Scanning|November 13, 2004
A novel technique for visualizing electron beam induced chargingXiaohu Tang, David C Joy
Scanning|August 21, 2003
Quantitative measurements of charging in a gaseous environmentXiaohu Tang, David C Joy
Scanning|December 24, 2005
An experimental model of beam broadening in the variable pressure scanning electron microscopeXiaohu Tang, David C Joy
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 9, 2011
Is microanalysis possible in the helium ion microscope?David C Joy, Brendan J Griffin
Scanning|May 17, 2012
Do SE(II) electrons really degrade SEM image quality?Gary H Bernstein, Andrew D Carter, David C Joy
Ultramicroscopy|January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devicesAlexander E Thesen, Bernhard G Frost, David C Joy
Nanotechnology|April 2, 2010
Monte Carlo simulation of focused helium ion beam induced depositionDaryl A Smith, David C Joy, Philip D Rack
Scanning|July 31, 2013
Electron beam induced radiation damage in the catalyst layer of a proton exchange membrane fuel cellQianping He, Jihua Chen, David J Keffer, et al.
Pageof 3

Showing results (1-10 of 24) with videos related to

Sort By:
Pageof 3
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Fundamental Constants for Quantitative X-ray MicroanalysisDavid C. Joy
Nature Materials|September 24, 2009
Scanning electron microscopy: Second best no moreDavid C Joy
Scanning|November 13, 2004
A novel technique for visualizing electron beam induced chargingXiaohu Tang, David C Joy
Scanning|August 21, 2003
Quantitative measurements of charging in a gaseous environmentXiaohu Tang, David C Joy
Scanning|December 24, 2005
An experimental model of beam broadening in the variable pressure scanning electron microscopeXiaohu Tang, David C Joy
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 9, 2011
Is microanalysis possible in the helium ion microscope?David C Joy, Brendan J Griffin
Scanning|May 17, 2012
Do SE(II) electrons really degrade SEM image quality?Gary H Bernstein, Andrew D Carter, David C Joy
Ultramicroscopy|January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devicesAlexander E Thesen, Bernhard G Frost, David C Joy
Nanotechnology|April 2, 2010
Monte Carlo simulation of focused helium ion beam induced depositionDaryl A Smith, David C Joy, Philip D Rack
Scanning|July 31, 2013
Electron beam induced radiation damage in the catalyst layer of a proton exchange membrane fuel cellQianping He, Jihua Chen, David J Keffer, et al.
Pageof 3