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Ultramicroscopy|June 17, 2025
Electron backscattering coefficient, material contrast and response function of BSE- detectors in scanning electron microscopyE I Rau, S V ZaitsevThe Review of Scientific Instruments|March 6, 2019
Backscattered electron detector for 3D microstructure visualization in scanning electron microscopyE I Rau, V Yu Karaulov, S V ZaitsevMicron (Oxford, England : 1993)|August 2, 2023
A novel method for measuring the charging kinetics of dielectrics under electron irradiation in SEME I Rau, A A Tatarintsev, E Yu ZykovaUltramicroscopy|September 29, 2004
Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samplesW K Wong, E I Rau, J T L ThongScanning|January 6, 2001
An anomalous contrast in scanning electron microscopy of insulators: the pseudo-mirror effectM Belhaj, O Jbara, S Odof, et al.Scanning|October 6, 2001
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopyM N Filippov, E I Rau, R A Sennov, et al.Ultramicroscopy|September 9, 2019
3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithmA A Borzunov, V Y Karaulov, N A Koshev, et al.Pageof 1