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Eberhard Manske

Showing results (1-10 of 12) with videos related to

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Sensors (Basel, Switzerland)|September 10, 2021
Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality ControlIngo Ortlepp, Jaqueline Stauffenberg, Eberhard Manske
Optics Express|October 19, 2017
Total momentum transfer produced by the photons of a multi-pass laser beam as an evident avenue for optical and mass metrologySuren Vasilyan, Thomas Fröhlich, Eberhard Manske
Micromachines|April 3, 2021
Phase-Modulated Standing Wave InterferometerIngo Ortlepp, Eberhard Manske, Jens-Peter Zöllner, et al.
Applied Optics|February 23, 2023
In situ, back-focal-plane-based determination of the numerical apertures in optical microscopesJan Krüger, Detlef Bergmann, Rainer Köning, et al.
Optics Express|September 15, 2023
Improved peak-to-peak method for cavity length measurement of a Fabry-Perot etalon using a mode-locked femtosecond laserDong Wook Shin, Hiraku Matsukuma, Ryo Sato, et al.
Optics Express|June 14, 2025
Near-common-optical-path two-axis surface encoder with a three-layer gratings interference methodYifan Hong, Ryo Sato, Zhiyang Zhang, et al.
Journal of Visualized Experiments : Jove|July 3, 2023
Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample InspectionFangzhou Xia, Kamal Youcef-Toumi, Thomas Sattel, et al.
The Review of Scientific Instruments|June 8, 2013
Modified Fabry-Perot interferometer for displacement measurement in ultra large measuring rangeChung-Ping Chang, Pi-Cheng Tung, Lih-Horng Shyu, et al.
Applied Optics|June 14, 2013
Multi-interferometric displacement measurement system with variable measurement mirrorsChung-Ping Chang, Pi-Cheng Tung, Lih-Horng Shyu, et al.
Sensors (Basel, Switzerland)|May 3, 2020
Linear Displacement Calibration System Integrated with a Novel Auto-Alignment Module for Optical AxesYi-Chieh Shih, Pi-Cheng Tung, Yung-Cheng Wang, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
Sensors (Basel, Switzerland)|September 10, 2021
Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality ControlIngo Ortlepp, Jaqueline Stauffenberg, Eberhard Manske
Optics Express|October 19, 2017
Total momentum transfer produced by the photons of a multi-pass laser beam as an evident avenue for optical and mass metrologySuren Vasilyan, Thomas Fröhlich, Eberhard Manske
Micromachines|April 3, 2021
Phase-Modulated Standing Wave InterferometerIngo Ortlepp, Eberhard Manske, Jens-Peter Zöllner, et al.
Applied Optics|February 23, 2023
In situ, back-focal-plane-based determination of the numerical apertures in optical microscopesJan Krüger, Detlef Bergmann, Rainer Köning, et al.
Optics Express|September 15, 2023
Improved peak-to-peak method for cavity length measurement of a Fabry-Perot etalon using a mode-locked femtosecond laserDong Wook Shin, Hiraku Matsukuma, Ryo Sato, et al.
Optics Express|June 14, 2025
Near-common-optical-path two-axis surface encoder with a three-layer gratings interference methodYifan Hong, Ryo Sato, Zhiyang Zhang, et al.
Journal of Visualized Experiments : Jove|July 3, 2023
Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample InspectionFangzhou Xia, Kamal Youcef-Toumi, Thomas Sattel, et al.
The Review of Scientific Instruments|June 8, 2013
Modified Fabry-Perot interferometer for displacement measurement in ultra large measuring rangeChung-Ping Chang, Pi-Cheng Tung, Lih-Horng Shyu, et al.
Applied Optics|June 14, 2013
Multi-interferometric displacement measurement system with variable measurement mirrorsChung-Ping Chang, Pi-Cheng Tung, Lih-Horng Shyu, et al.
Sensors (Basel, Switzerland)|May 3, 2020
Linear Displacement Calibration System Integrated with a Novel Auto-Alignment Module for Optical AxesYi-Chieh Shih, Pi-Cheng Tung, Yung-Cheng Wang, et al.
Pageof 2