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Eric Lifshin

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Minimizing Errors in Electron Microprobe AnalysisEric Lifshin, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 16, 2013
Improving scanning electron microscope resolution for near planar samples through the use of image restorationEric Lifshin, Yudhishthir P Kandel, Richard L Moore
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 31, 2019
Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope-Part II: Effect on Image Restoration QualityMandy C Nevins, Richard K Hailstone, Eric Lifshin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 22, 2010
Development of a new quantitative X-ray microanalysis method for electron microscopyPaula Horny, Eric Lifshin, Helen Campbell, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscopeRaynald Gauvin, Eric Lifshin, Hendrix Demers, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 28, 2019
Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope-Part I: Effect on the Point Spread FunctionMandy C Nevins, Kathryn Quoi, Richard K Hailstone, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2018
The Determination and Application of the Point Spread Function in the Scanning Electron MicroscopeMatthew D Zotta, Mandy C Nevins, Richard K Hailstone, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Minimizing Errors in Electron Microprobe AnalysisEric Lifshin, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 16, 2013
Improving scanning electron microscope resolution for near planar samples through the use of image restorationEric Lifshin, Yudhishthir P Kandel, Richard L Moore
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 31, 2019
Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope-Part II: Effect on Image Restoration QualityMandy C Nevins, Richard K Hailstone, Eric Lifshin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 22, 2010
Development of a new quantitative X-ray microanalysis method for electron microscopyPaula Horny, Eric Lifshin, Helen Campbell, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscopeRaynald Gauvin, Eric Lifshin, Hendrix Demers, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 28, 2019
Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope-Part I: Effect on the Point Spread FunctionMandy C Nevins, Kathryn Quoi, Richard K Hailstone, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2018
The Determination and Application of the Point Spread Function in the Scanning Electron MicroscopeMatthew D Zotta, Mandy C Nevins, Richard K Hailstone, et al.
Pageof 1