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Eric Ziegler

Showing results (1-10 of 12) with videos related to

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Optics Letters|November 2, 2012
Grating-based at-wavelength metrology of hard x-ray reflective opticsSebastien Berujon, Eric Ziegler
Journal of Synchrotron Radiation|July 3, 2015
X-ray pulse wavefront metrology using speckle trackingSebastien Berujon, Eric Ziegler, Peter Cloetens
Optics Express|June 4, 2008
Exact determination of the phase in time-resolved X-ray reflectometryIgor Kozhevnikov, Luca Peverini, Eric Ziegler
Physical Review Letters|May 17, 2012
Two-dimensional x-ray beam phase sensingSébastien Bérujon, Eric Ziegler, Roberto Cerbino, et al.
Optics Express|September 22, 2011
X-ray wavefront characterization using a rotating shearing interferometer techniqueHongchang Wang, Kawal Sawhney, Sébastien Berujon, et al.
Journal of Synchrotron Radiation|February 16, 2013
X-ray diffraction imaging of metal-oxide epitaxial tunnel junctions made by optical lithography: use of focused and unfocused X-ray beamsCristian Mocuta, Antoine Barbier, Stefan Stanescu, et al.
Journal of Synchrotron Radiation|March 11, 2020
X-ray optics and beam characterization using random modulation: experimentsSebastien Berujon, Ruxandra Cojocaru, Pierre Piault, et al.
Optics Express|June 6, 2009
X-ray phase imaging with a grating interferometerTimm Weitkamp, Ana Diaz, Christian David, et al.
Journal of Synchrotron Radiation|March 11, 2020
X-ray optics and beam characterization using random modulation: theorySebastien Berujon, Ruxandra Cojocaru, Pierre Piault, et al.
Applied Optics|May 10, 2003
W/SiC x-ray multilayers optimized for use above 100 keVDavid L Windt, Soizik Donguy, Charles J Hailey, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
Optics Letters|November 2, 2012
Grating-based at-wavelength metrology of hard x-ray reflective opticsSebastien Berujon, Eric Ziegler
Journal of Synchrotron Radiation|July 3, 2015
X-ray pulse wavefront metrology using speckle trackingSebastien Berujon, Eric Ziegler, Peter Cloetens
Optics Express|June 4, 2008
Exact determination of the phase in time-resolved X-ray reflectometryIgor Kozhevnikov, Luca Peverini, Eric Ziegler
Physical Review Letters|May 17, 2012
Two-dimensional x-ray beam phase sensingSébastien Bérujon, Eric Ziegler, Roberto Cerbino, et al.
Optics Express|September 22, 2011
X-ray wavefront characterization using a rotating shearing interferometer techniqueHongchang Wang, Kawal Sawhney, Sébastien Berujon, et al.
Journal of Synchrotron Radiation|February 16, 2013
X-ray diffraction imaging of metal-oxide epitaxial tunnel junctions made by optical lithography: use of focused and unfocused X-ray beamsCristian Mocuta, Antoine Barbier, Stefan Stanescu, et al.
Journal of Synchrotron Radiation|March 11, 2020
X-ray optics and beam characterization using random modulation: experimentsSebastien Berujon, Ruxandra Cojocaru, Pierre Piault, et al.
Optics Express|June 6, 2009
X-ray phase imaging with a grating interferometerTimm Weitkamp, Ana Diaz, Christian David, et al.
Journal of Synchrotron Radiation|March 11, 2020
X-ray optics and beam characterization using random modulation: theorySebastien Berujon, Ruxandra Cojocaru, Pierre Piault, et al.
Applied Optics|May 10, 2003
W/SiC x-ray multilayers optimized for use above 100 keVDavid L Windt, Soizik Donguy, Charles J Hailey, et al.
Pageof 2