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Florian F Krause

Showing results (1-10 of 34) with videos related to

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Micron (Oxford, England : 1993)|November 7, 2016
Reciprocity relations in transmission electron microscopy: A rigorous derivationFlorian F Krause, Andreas Rosenauer
Ultramicroscopy|October 23, 2023
Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction schemeFlorian F Krause, Andreas Rosenauer
Ultramicroscopy|May 22, 2017
Imaging theory for the ISTEM imaging modeFlorian F Krause, Andreas Rosenauer, Dirk Van Dyck
Physical Review Letters|September 13, 2014
Conventional transmission electron microscopy imaging beyond the diffraction and information limitsAndreas Rosenauer, Florian F Krause, Knut Müller, et al.
Ultramicroscopy|March 12, 2022
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potentialChristoph Mahr, Tim Grieb, Florian F Krause, et al.
Ultramicroscopy|July 5, 2013
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methodsFlorian F Krause, Knut Müller, Dennis Zillmann, et al.
Ultramicroscopy|April 17, 2018
Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaNFlorian F Krause, Dennis Bredemeier, Marco Schowalter, et al.
Ultramicroscopy|December 19, 2020
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methodsChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.
Ultramicroscopy|May 28, 2021
Accuracy and precision of position determination in ISTEM imaging of BaTiO<sub>3</sub>Dennis Marquardt, Marco Schowalter, Florian F Krause, et al.
Pageof 4

Showing results (1-10 of 34) with videos related to

Sort By:
Pageof 4
Micron (Oxford, England : 1993)|November 7, 2016
Reciprocity relations in transmission electron microscopy: A rigorous derivationFlorian F Krause, Andreas Rosenauer
Ultramicroscopy|October 23, 2023
Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction schemeFlorian F Krause, Andreas Rosenauer
Ultramicroscopy|May 22, 2017
Imaging theory for the ISTEM imaging modeFlorian F Krause, Andreas Rosenauer, Dirk Van Dyck
Physical Review Letters|September 13, 2014
Conventional transmission electron microscopy imaging beyond the diffraction and information limitsAndreas Rosenauer, Florian F Krause, Knut Müller, et al.
Ultramicroscopy|March 12, 2022
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potentialChristoph Mahr, Tim Grieb, Florian F Krause, et al.
Ultramicroscopy|July 5, 2013
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methodsFlorian F Krause, Knut Müller, Dennis Zillmann, et al.
Ultramicroscopy|April 17, 2018
Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaNFlorian F Krause, Dennis Bredemeier, Marco Schowalter, et al.
Ultramicroscopy|December 19, 2020
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methodsChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.
Ultramicroscopy|May 28, 2021
Accuracy and precision of position determination in ISTEM imaging of BaTiO<sub>3</sub>Dennis Marquardt, Marco Schowalter, Florian F Krause, et al.
Pageof 4