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Fumio Hosokawa

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Acta Crystallographica. Section D, Structural Biology|July 1, 2021
Evaluation of automated particle picking for cryogenic electron microscopy using high-precision transmission electron microscope simulation based on a multi-slice methodMasataka Ohashi, Fumio Hosokawa, Takao Shinkawa, et al.
Micron (Oxford, England : 1993)|March 13, 2014
Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEMHidetaka Sawada, Takeo Sasaki, Fumio Hosokawa, et al.
Journal of Electron Microscopy|August 27, 2005
Transfer doublet and an elaborated phase plate holder for 120 kV electron-phase microscopeFumio Hosokawa, Radostin Danev, Yoshihiro Arai, et al.
Ultramicroscopy|May 8, 2016
Image transfer with spatial coherence for aberration corrected transmission electron microscopesFumio Hosokawa, Hidetaka Sawada, Takao Shinkawa, et al.
Ultramicroscopy|July 18, 2015
Benchmark test of accelerated multi-slice simulation by GPGPUFumio Hosokawa, Takao Shinkawa, Yoshihiro Arai, et al.
Microscopy (Oxford, England)|March 10, 2015
Phase-contrast scanning transmission electron microscopyHiroki Minoda, Takayuki Tamai, Hirofumi Iijima, et al.
Ultramicroscopy|May 21, 2014
Aberration-corrected STEM/TEM imaging at 15kVTakeo Sasaki, Hidetaka Sawada, Fumio Hosokawa, et al.
Microscopy (Oxford, England)|February 24, 2018
Evaluation of residual aberration in fifth-order geometrical aberration correctorsShigeyuki Morishita, Yuji Kohno, Fumio Hosokawa, et al.
Microscopy (Oxford, England)|April 1, 2015
Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEMHidetaka Sawada, Naoki Shimura, Fumio Hosokawa, et al.
Microscopy (Oxford, England)|February 8, 2013
Development of Cs and Cc correctors for transmission electron microscopyFumio Hosokawa, Hidetaka Sawada, Yukihito Kondo, et al.
Pageof 2

Showing results (1-10 of 19) with videos related to

Sort By:
Pageof 2
Acta Crystallographica. Section D, Structural Biology|July 1, 2021
Evaluation of automated particle picking for cryogenic electron microscopy using high-precision transmission electron microscope simulation based on a multi-slice methodMasataka Ohashi, Fumio Hosokawa, Takao Shinkawa, et al.
Micron (Oxford, England : 1993)|March 13, 2014
Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEMHidetaka Sawada, Takeo Sasaki, Fumio Hosokawa, et al.
Journal of Electron Microscopy|August 27, 2005
Transfer doublet and an elaborated phase plate holder for 120 kV electron-phase microscopeFumio Hosokawa, Radostin Danev, Yoshihiro Arai, et al.
Ultramicroscopy|May 8, 2016
Image transfer with spatial coherence for aberration corrected transmission electron microscopesFumio Hosokawa, Hidetaka Sawada, Takao Shinkawa, et al.
Ultramicroscopy|July 18, 2015
Benchmark test of accelerated multi-slice simulation by GPGPUFumio Hosokawa, Takao Shinkawa, Yoshihiro Arai, et al.
Microscopy (Oxford, England)|March 10, 2015
Phase-contrast scanning transmission electron microscopyHiroki Minoda, Takayuki Tamai, Hirofumi Iijima, et al.
Ultramicroscopy|May 21, 2014
Aberration-corrected STEM/TEM imaging at 15kVTakeo Sasaki, Hidetaka Sawada, Fumio Hosokawa, et al.
Microscopy (Oxford, England)|February 24, 2018
Evaluation of residual aberration in fifth-order geometrical aberration correctorsShigeyuki Morishita, Yuji Kohno, Fumio Hosokawa, et al.
Microscopy (Oxford, England)|April 1, 2015
Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEMHidetaka Sawada, Naoki Shimura, Fumio Hosokawa, et al.
Microscopy (Oxford, England)|February 8, 2013
Development of Cs and Cc correctors for transmission electron microscopyFumio Hosokawa, Hidetaka Sawada, Yukihito Kondo, et al.
Pageof 2