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Hidetaka Sawada

Showing results (1-10 of 51) with videos related to

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Ultramicroscopy|June 11, 2022
Theoretical study on sixth-order geometrical aberration correctionShigeyuki Morishita, Hidetaka Sawada
Journal of Electron Microscopy|March 13, 2003
Imaging of a single atomic column in silicon grain boundaryHidetaka Sawada, Hideki Ichinose, Masanori Kohyama
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 2, 2012
Ad hoc auto-tuning of aberrations using high-resolution STEM images by autocorrelation functionHidetaka Sawada, Masashi Watanabe, Izuru Chiyo
Journal of Electron Microscopy|June 18, 2005
First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEMJun Yamasaki, Hidetaka Sawada, Nobuo Tanaka
Physical Review Letters|October 22, 2016
Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron MicroscopeShigeyuki Morishita, Masaki Mukai, Kazu Suenaga, et al.
Physical Review Letters|October 2, 2009
Atomic structure imaging beyond conventional resolution limits in the transmission electron microscopeSarah J Haigh, Hidetaka Sawada, Angus I Kirkland
Micron (Oxford, England : 1993)|March 13, 2014
Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEMHidetaka Sawada, Takeo Sasaki, Fumio Hosokawa, et al.
Ultramicroscopy|May 8, 2016
Image transfer with spatial coherence for aberration corrected transmission electron microscopesFumio Hosokawa, Hidetaka Sawada, Takao Shinkawa, et al.
Ultramicroscopy|April 6, 2017
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical couplingAlan J Craven, Hidetaka Sawada, Sam McFadzean, et al.
Ultramicroscopy|May 21, 2014
Aberration-corrected STEM/TEM imaging at 15kVTakeo Sasaki, Hidetaka Sawada, Fumio Hosokawa, et al.
Pageof 6

Showing results (1-10 of 51) with videos related to

Sort By:
Pageof 6
Ultramicroscopy|June 11, 2022
Theoretical study on sixth-order geometrical aberration correctionShigeyuki Morishita, Hidetaka Sawada
Journal of Electron Microscopy|March 13, 2003
Imaging of a single atomic column in silicon grain boundaryHidetaka Sawada, Hideki Ichinose, Masanori Kohyama
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 2, 2012
Ad hoc auto-tuning of aberrations using high-resolution STEM images by autocorrelation functionHidetaka Sawada, Masashi Watanabe, Izuru Chiyo
Journal of Electron Microscopy|June 18, 2005
First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEMJun Yamasaki, Hidetaka Sawada, Nobuo Tanaka
Physical Review Letters|October 22, 2016
Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron MicroscopeShigeyuki Morishita, Masaki Mukai, Kazu Suenaga, et al.
Physical Review Letters|October 2, 2009
Atomic structure imaging beyond conventional resolution limits in the transmission electron microscopeSarah J Haigh, Hidetaka Sawada, Angus I Kirkland
Micron (Oxford, England : 1993)|March 13, 2014
Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEMHidetaka Sawada, Takeo Sasaki, Fumio Hosokawa, et al.
Ultramicroscopy|May 8, 2016
Image transfer with spatial coherence for aberration corrected transmission electron microscopesFumio Hosokawa, Hidetaka Sawada, Takao Shinkawa, et al.
Ultramicroscopy|April 6, 2017
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical couplingAlan J Craven, Hidetaka Sawada, Sam McFadzean, et al.
Ultramicroscopy|May 21, 2014
Aberration-corrected STEM/TEM imaging at 15kVTakeo Sasaki, Hidetaka Sawada, Fumio Hosokawa, et al.
Pageof 6