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Ultramicroscopy|May 21, 2017
Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metricJ A Pollock, M Weyland, D J Taplin, et al.Ultramicroscopy|November 9, 2016
Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopyZ Chen, D J Taplin, M Weyland, et al.Ultramicroscopy|May 26, 2015
Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopyZ Chen, A J D'Alfonso, M Weyland, et al.Ultramicroscopy|July 25, 2016
Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probesD J Taplin, N Shibata, M Weyland, et al.Physical Review Letters|January 13, 2019
Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron ProbeH G Brown, Z Chen, M Weyland, et al.Ultramicroscopy|May 2, 2007
Imaging using inelastically scattered electrons in CTEM and STEM geometryS D Findlay, P Schattschneider, L J AllenUltramicroscopy|August 13, 2016
Practical aspects of diffractive imaging using an atomic-scale coherent electron probeZ Chen, M Weyland, P Ercius, et al.Ultramicroscopy|September 2, 2016
Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopyJ H Dycus, W Xu, X Sang, et al.Ultramicroscopy|June 4, 2016
Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopyZ Chen, M Weyland, X Sang, et al.Ultramicroscopy|December 4, 2014
Modelling the inelastic scattering of fast electronsL J Allen, A J D Alfonso, S D FindlayPageof 15