Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Jun Uzuhashi

Showing results (1-10 of 14) with videos related to

Pageof 2
Sort By:
Ultramicroscopy|May 3, 2024
Systematic study of FIB-induced damage for the high-quality TEM sample preparationJun Uzuhashi, Tadakatsu Ohkubo
Ultramicroscopy|February 23, 2023
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEMJun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 5, 2024
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron MicroscopyJun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono
Microscopy (Oxford, England)|January 31, 2025
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEMJun Uzuhashi, Yuanzhao Yao, Tadakatsu Ohkubo, et al.
Small Methods|February 23, 2024
Robust Preparation of Sub-20-nm-Thin Lamellae for Aberration-Corrected Electron MicroscopyHideyo Tsurusawa, Jun Uzuhashi, Yusuke Kozuka, et al.
Nanotechnology|May 31, 2018
Investigation of nanoscale voids in Sb-doped p-type ZnO nanowiresKen C Pradel, Jun Uzuhashi, Toshiaki Takei, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|April 24, 2026
Heating-induced irreversible change in temperature modulation induced by the spin Peltier effect in Pt/Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub>systemsAtsushi Takahagi, Takamasa Hirai, Jun Uzuhashi, et al.
Nano Letters|September 1, 2022
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum WellsYudai Yamaguchi, Yuya Kanitani, Yoshihiro Kudo, et al.
Nanoscale|October 12, 2021
Stable field-emission from a CeB<sub>6</sub> nanoneedle point electron sourceShuai Tang, Jie Tang, Yimeng Wu, et al.
Nano Letters|December 23, 2025
Light-Programmable Reorientation of the Crystallographic <i>c</i> Axis of Tellurium Thin FilmsYuta Kobayashi, Arata Mitsuzuka, Haruo Kondo, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|May 3, 2024
Systematic study of FIB-induced damage for the high-quality TEM sample preparationJun Uzuhashi, Tadakatsu Ohkubo
Ultramicroscopy|February 23, 2023
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEMJun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 5, 2024
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron MicroscopyJun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono
Microscopy (Oxford, England)|January 31, 2025
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEMJun Uzuhashi, Yuanzhao Yao, Tadakatsu Ohkubo, et al.
Small Methods|February 23, 2024
Robust Preparation of Sub-20-nm-Thin Lamellae for Aberration-Corrected Electron MicroscopyHideyo Tsurusawa, Jun Uzuhashi, Yusuke Kozuka, et al.
Nanotechnology|May 31, 2018
Investigation of nanoscale voids in Sb-doped p-type ZnO nanowiresKen C Pradel, Jun Uzuhashi, Toshiaki Takei, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|April 24, 2026
Heating-induced irreversible change in temperature modulation induced by the spin Peltier effect in Pt/Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub>systemsAtsushi Takahagi, Takamasa Hirai, Jun Uzuhashi, et al.
Nano Letters|September 1, 2022
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum WellsYudai Yamaguchi, Yuya Kanitani, Yoshihiro Kudo, et al.
Nanoscale|October 12, 2021
Stable field-emission from a CeB<sub>6</sub> nanoneedle point electron sourceShuai Tang, Jie Tang, Yimeng Wu, et al.
Nano Letters|December 23, 2025
Light-Programmable Reorientation of the Crystallographic <i>c</i> Axis of Tellurium Thin FilmsYuta Kobayashi, Arata Mitsuzuka, Haruo Kondo, et al.
Pageof 2