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Ki-Nam Joo

Showing results (1-10 of 35) with videos related to

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Applied Optics|February 12, 2014
Sub-sampling low coherence scanning interferometry and its application: refractive index measurements of a silicon waferKi-Nam Joo
Sensors (Basel, Switzerland)|November 27, 2019
Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting InterferometryJun Woo Jeon, Ki-Nam Joo
Optics Express|January 18, 2019
Novel combined measurement system to characterize film structures by spectral interferometry and ellipsometryYoung Ho Yun, Ki-Nam Joo
Applied Optics|September 11, 2019
Single-shot characterization of multi-film structures based on combined spectral interferometry and spatially recorded spectroscopic ellipsometryJin Sub Kim, Ki-Nam Joo
Micromachines|July 27, 2022
Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film StructuresKi-Nam Joo, Hyo-Mi Park
Applied Optics|May 3, 2023
Surface figure measurement tool based on a radial shearing interferometer using a geometric phase lens with various spherical wavefrontsHyo Mi Park, Ki-Nam Joo
Applied Optics|November 2, 2017
High-speed combined NIR low-coherence interferometry for wafer metrologyHyo Mi Park, Ki-Nam Joo
Optics Letters|February 20, 2007
Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laserKi-Nam Joo, Seung-Woo Kim
Optics Express|June 12, 2009
Absolute distance measurement by dispersive interferometry using a femtosecond pulse laserKi-Nam Joo, Seung-Woo Kim
Sensors (Basel, Switzerland)|April 30, 2021
Motionless Polarizing Structured Illumination MicroscopyHyo Mi Park, Ki-Nam Joo
Pageof 4

Showing results (1-10 of 35) with videos related to

Sort By:
Pageof 4
Applied Optics|February 12, 2014
Sub-sampling low coherence scanning interferometry and its application: refractive index measurements of a silicon waferKi-Nam Joo
Sensors (Basel, Switzerland)|November 27, 2019
Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting InterferometryJun Woo Jeon, Ki-Nam Joo
Optics Express|January 18, 2019
Novel combined measurement system to characterize film structures by spectral interferometry and ellipsometryYoung Ho Yun, Ki-Nam Joo
Applied Optics|September 11, 2019
Single-shot characterization of multi-film structures based on combined spectral interferometry and spatially recorded spectroscopic ellipsometryJin Sub Kim, Ki-Nam Joo
Micromachines|July 27, 2022
Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film StructuresKi-Nam Joo, Hyo-Mi Park
Applied Optics|May 3, 2023
Surface figure measurement tool based on a radial shearing interferometer using a geometric phase lens with various spherical wavefrontsHyo Mi Park, Ki-Nam Joo
Applied Optics|November 2, 2017
High-speed combined NIR low-coherence interferometry for wafer metrologyHyo Mi Park, Ki-Nam Joo
Optics Letters|February 20, 2007
Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laserKi-Nam Joo, Seung-Woo Kim
Optics Express|June 12, 2009
Absolute distance measurement by dispersive interferometry using a femtosecond pulse laserKi-Nam Joo, Seung-Woo Kim
Sensors (Basel, Switzerland)|April 30, 2021
Motionless Polarizing Structured Illumination MicroscopyHyo Mi Park, Ki-Nam Joo
Pageof 4