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Lawrence H Friedman

Showing results (1-10 of 12) with videos related to

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The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|June 17, 2024
Thermodynamically Stable Colloidal Solids: Interfacial Thermodynamics from the Particle Size DistributionAndrew Nelson, Lawrence H Friedman
Applied Physics Letters|March 14, 2020
Electron Reflectometry for Measuring Nanostructures on Opaque SubstratesLawrence H Friedman, Wen-Li Wu
Ultramicroscopy|September 2, 2017
Strain measurement of 3D structured nanodevices by EBSDWilliam Osborn, Lawrence H Friedman, Mark Vaudin
Journal of Applied Physics|June 23, 2016
Stochastic behavior of nanoscale dielectric wall bucklingLawrence H Friedman, Igor Levin, Robert F Cook
Applied Physics Letters|December 16, 2017
Reflective Small Angle Electron Scattering to Characterize Nanostructures on Opaque SubstratesLawrence H Friedman, Wen-Li Wu, Wei-En Fu, et al.
The Review of Scientific Instruments|October 7, 2011
Prototype cantilevers for quantitative lateral force microscopyMark G Reitsma, Richard S Gates, Lawrence H Friedman, et al.
Journal of Research of the National Institute of Standards and Technology|April 25, 2022
Microscale Mapping of Structure and Stress in Barium TitanateJane A Howell, Mark D Vaudin, Lawrence H Friedman, et al.
Applied Physics Letters|October 9, 2024
High-throughput bend-strengths of ultra-small polysilicon MEMS componentsRobert F Cook, Brad L Boyce, Lawrence H Friedman, et al.
Nanotechnology|June 22, 2016
Near-theoretical fracture strengths in native and oxidized silicon nanowiresFrank W DelRio, Ryan M White, Sergiy Krylyuk, et al.
Ultramicroscopy|March 4, 2016
Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented SiLawrence H Friedman, Mark D Vaudin, Stephan J Stranick, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|June 17, 2024
Thermodynamically Stable Colloidal Solids: Interfacial Thermodynamics from the Particle Size DistributionAndrew Nelson, Lawrence H Friedman
Applied Physics Letters|March 14, 2020
Electron Reflectometry for Measuring Nanostructures on Opaque SubstratesLawrence H Friedman, Wen-Li Wu
Ultramicroscopy|September 2, 2017
Strain measurement of 3D structured nanodevices by EBSDWilliam Osborn, Lawrence H Friedman, Mark Vaudin
Journal of Applied Physics|June 23, 2016
Stochastic behavior of nanoscale dielectric wall bucklingLawrence H Friedman, Igor Levin, Robert F Cook
Applied Physics Letters|December 16, 2017
Reflective Small Angle Electron Scattering to Characterize Nanostructures on Opaque SubstratesLawrence H Friedman, Wen-Li Wu, Wei-En Fu, et al.
The Review of Scientific Instruments|October 7, 2011
Prototype cantilevers for quantitative lateral force microscopyMark G Reitsma, Richard S Gates, Lawrence H Friedman, et al.
Journal of Research of the National Institute of Standards and Technology|April 25, 2022
Microscale Mapping of Structure and Stress in Barium TitanateJane A Howell, Mark D Vaudin, Lawrence H Friedman, et al.
Applied Physics Letters|October 9, 2024
High-throughput bend-strengths of ultra-small polysilicon MEMS componentsRobert F Cook, Brad L Boyce, Lawrence H Friedman, et al.
Nanotechnology|June 22, 2016
Near-theoretical fracture strengths in native and oxidized silicon nanowiresFrank W DelRio, Ryan M White, Sergiy Krylyuk, et al.
Ultramicroscopy|March 4, 2016
Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented SiLawrence H Friedman, Mark D Vaudin, Stephan J Stranick, et al.
Pageof 2