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Micron (Oxford, England : 1993)|September 24, 2021
Prismatic 2.0 - Simulation software for scanning and high resolution transmission electron microscopy (STEM and HRTEM)Luis Rangel DaCosta, Hamish G Brown, Philipp M Pelz, et al.
ACS Omega|January 26, 2026
Erratum: Addition to "Chemical Compensation Challenges in Processing Antiferroelectric PbZrO<sub>3</sub> Thin Films"Milan H Haddad, Vasily Lebedev, Kristina Holsgrove, et al.
ACS Omega|July 21, 2025
Chemical Compensation Challenges in Processing Antiferroelectric PbZrO<sub>3</sub> Thin FilmsMilan H Haddad, Vasily Lebedev, Kristina Holsgrove, et al.
Ultramicroscopy|July 31, 2013
Contrast in atomically resolved EF-SCEM imagingPeng Wang, Adrian J D'Alfonso, Ayako Hashimoto, et al.
Nature Communications|January 4, 2024
Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomographyCian Gabbett, Luke Doolan, Kevin Synnatschke, et al.
Small Methods|September 30, 2022
Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-ray SpectroscopyAnnick De Backer, Zezhong Zhang, Karel H W van den Bos, et al.
Ultramicroscopy|March 25, 2014
The development of a 200 kV monochromated field emission electron sourceMasaki Mukai, Judy S Kim, Kazuya Omoto, et al.
Ultramicroscopy|November 25, 2010
Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscopePeng Wang, Gavin Behan, Angus I Kirkland, et al.
Nature Communications|May 25, 2023
Cryogenic electron ptychographic single particle analysis with wide bandwidth information transferXudong Pei, Liqi Zhou, Chen Huang, et al.
Science (New York, N.Y.)|October 30, 2020
Atomic-scale microstructure of metal halide perovskiteMathias Uller Rothmann, Judy S Kim, Juliane Borchert, et al.
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