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Applied Optics|March 9, 2010
Ellipsometer nulling: coupling and setting uncertaintyM P Kothiyal
Applied Optics|February 16, 2010
Transmittance ratio of a compensatorM P Kothiyal
The Review of Scientific Instruments|May 5, 2007
Simple technique for obtaining photoacoustic spectra corrected for the spectral variation of the source in single scanK Sathiyamoorthy, C Vijayan, M P Kothiyal
Applied Optics|March 14, 2008
Heterodyne temporal speckle-pattern interferometryP Haible, M P Kothiyal, H J Tiziani
Applied Optics|August 25, 2010
Direct determination of focal length by using Talbot interferometryK V Sriram, M P Kothiyal, R S Sirohi
Applied Optics|October 14, 2010
Collimation testing with linear dual-field, spiral, and evolute gratings: a comparative studyK V Sriram, M P Kothiyal, R S Sirohi
Optics Letters|May 19, 2009
Microscopic TV shearography for characterization of microsystemsU Paul Kumar, M P Kothiyal, N Krishna Mohan
Applied Optics|August 19, 2010
Talbot interferometry in noncollimated illumination for curvature and focal length measurementsK V Sriram, M P Kothiyal, R S Sirohi
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