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Marc De Graef

Showing results (21-30 of 33) with videos related to

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Ultramicroscopy|April 16, 2018
Corrigendum to "Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope" Ultramicroscopy 187 (2018) 98-106Elena Pascal, Saransh Singh, Patrick G Callahan, et al.
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|August 20, 2013
A model based iterative reconstruction algorithm for high angle annular dark field-scanning transmission electron microscope (HAADF-STEM) tomographyS V Venkatakrishnan, Lawrence F Drummy, Michael A Jackson, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 19, 2018
Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural NetworksDipendra Jha, Saransh Singh, Reda Al-Bahrani, et al.
Ultramicroscopy|September 7, 2015
Introduction and comparison of new EBSD post-processing methodologiesStuart I Wright, Matthew M Nowell, Scott P Lindeman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 11, 2016
Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter DiffractionBrian E Jackson, Jordan J Christensen, Saransh Singh, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2017
Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)Landon T Hansen, Brian E Jackson, David T Fullwood, et al.
Ultramicroscopy|December 19, 2025
Energy-resolved EBSD using a monolithic direct electron detectorNicolò M Della Ventura, Kalani Moore, McLean P Echlin, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 10, 2015
A Dictionary Approach to Electron Backscatter Diffraction IndexingYu H Chen, Se Un Park, Dennis Wei, et al.
Ultramicroscopy|December 22, 2017
Transmission scanning electron microscopy: Defect observations and image simulationsPatrick G Callahan, Jean-Charles Stinville, Eric R Yao, et al.
Ultramicroscopy|November 16, 2020
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisitionFulin Wang, McLean P Echlin, Aidan A Taylor, et al.
Pageof 4

Showing results (21-30 of 33) with videos related to

Sort By:
Pageof 4
Ultramicroscopy|April 16, 2018
Corrigendum to "Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope" Ultramicroscopy 187 (2018) 98-106Elena Pascal, Saransh Singh, Patrick G Callahan, et al.
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|August 20, 2013
A model based iterative reconstruction algorithm for high angle annular dark field-scanning transmission electron microscope (HAADF-STEM) tomographyS V Venkatakrishnan, Lawrence F Drummy, Michael A Jackson, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 19, 2018
Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural NetworksDipendra Jha, Saransh Singh, Reda Al-Bahrani, et al.
Ultramicroscopy|September 7, 2015
Introduction and comparison of new EBSD post-processing methodologiesStuart I Wright, Matthew M Nowell, Scott P Lindeman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 11, 2016
Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter DiffractionBrian E Jackson, Jordan J Christensen, Saransh Singh, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2017
Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)Landon T Hansen, Brian E Jackson, David T Fullwood, et al.
Ultramicroscopy|December 19, 2025
Energy-resolved EBSD using a monolithic direct electron detectorNicolò M Della Ventura, Kalani Moore, McLean P Echlin, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 10, 2015
A Dictionary Approach to Electron Backscatter Diffraction IndexingYu H Chen, Se Un Park, Dennis Wei, et al.
Ultramicroscopy|December 22, 2017
Transmission scanning electron microscopy: Defect observations and image simulationsPatrick G Callahan, Jean-Charles Stinville, Eric R Yao, et al.
Ultramicroscopy|November 16, 2020
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisitionFulin Wang, McLean P Echlin, Aidan A Taylor, et al.
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