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Optics Express
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June 6, 2019
Quadrature-based interferometry using pulsed RGB illumination
Markus Schake, Peter Lehmann
Optics Express
|
June 6, 2019
Temporal high-resolution evaluation algorithm for sinusoidally phase modulated interference signals
Stanislav Tereschenko, Marcel Dissemond, Kevin Weinke, et al.
Optics Express
|
January 22, 2015
Continuous measurement of optical surfaces using a line-scan interferometer with sinusoidal path length modulation
Holger Knell, Sören Laubach, Gerd Ehret, et al.
Optics Express
|
April 4, 2018
Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limit
Peter Lehmann, Weichang Xie, Benedikt Allendorf, et al.
Optics Express
|
July 14, 2016
Signal modeling in low coherence interference microscopy on example of rectangular grating
Weichang Xie, Peter Lehmann, Jan Niehues, et al.
Optics Express
|
December 31, 2020
3D modeling of coherence scanning interferometry on 2D surfaces using FEM
Tobias Pahl, Sebastian Hagemeier, Marco Künne, et al.
Optics Express
|
August 9, 2017
System spectrum conversion from white light interferogram
Risto Montonen, Anton Nolvi, Stanislav Tereschenko, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 7) with videos related to
Sort By:
Page
of 1
Optics Express
|
June 6, 2019
Quadrature-based interferometry using pulsed RGB illumination
Markus Schake, Peter Lehmann
Optics Express
|
June 6, 2019
Temporal high-resolution evaluation algorithm for sinusoidally phase modulated interference signals
Stanislav Tereschenko, Marcel Dissemond, Kevin Weinke, et al.
Optics Express
|
January 22, 2015
Continuous measurement of optical surfaces using a line-scan interferometer with sinusoidal path length modulation
Holger Knell, Sören Laubach, Gerd Ehret, et al.
Optics Express
|
April 4, 2018
Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limit
Peter Lehmann, Weichang Xie, Benedikt Allendorf, et al.
Optics Express
|
July 14, 2016
Signal modeling in low coherence interference microscopy on example of rectangular grating
Weichang Xie, Peter Lehmann, Jan Niehues, et al.
Optics Express
|
December 31, 2020
3D modeling of coherence scanning interferometry on 2D surfaces using FEM
Tobias Pahl, Sebastian Hagemeier, Marco Künne, et al.
Optics Express
|
August 9, 2017
System spectrum conversion from white light interferogram
Risto Montonen, Anton Nolvi, Stanislav Tereschenko, et al.
Page
of 1