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Misa Hayashida

Showing results (11-20 of 30) with videos related to

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Micron (Oxford, England : 1993)|September 30, 2022
Origin of spurious intensity in vacuum near sample edge in bright field TEM imagesMisa Hayashida, Marek Malac, Jun Yamasaki
The Review of Scientific Instruments|November 4, 2011
Calibration method of tilt and azimuth angles for alignment of TEM tomographic tilt seriesMisa Hayashida, Shinya Terauchi, Toshiyuki Fujimoto
Micron (Oxford, England : 1993)|October 19, 2006
Development of computer-assisted minimal-dose system with beam blanker for TEMMisa Hayashida, Tsunenori Nomaguchi, Yoshihide Kimura, et al.
Ultramicroscopy|March 3, 2018
Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEMMisa Hayashida, Kai Cui, Marek Malac, et al.
Micron (Oxford, England : 1993)|May 1, 2012
Position-controlled marker formation by helium ion microscope for aligning a TEM tomographic tilt seriesMisa Hayashida, Tomohiko Iijima, Toshiyuki Fujimoto, et al.
Ultramicroscopy|May 20, 2014
Nano-dot markers for electron tomography formed by electron beam-induced deposition: nanoparticle agglomerates applicationMisa Hayashida, Marek Malac, Michael Bergen, et al.
Micron (Oxford, England : 1993)|September 21, 2019
3D observation of chromosome scaffold structure using a 360° electron tomography sample holderRinyaporn Phengchat, Misa Hayashida, Nobuko Ohmido, et al.
The Review of Scientific Instruments|September 1, 2014
Accurate measurement of relative tilt and azimuth angles in electron tomography: a comparison of fiducial marker method with electron diffractionMisa Hayashida, Marek Malac, Michael Bergen, et al.
Nanotechnology|July 2, 2024
3D imaging photocatalytically degraded micro- and nanoplasticsAleksander Cholewinski, Joseph Wortman, Misa Hayashida, et al.
Micron (Oxford, England : 1993)|May 31, 2019
Parameters affecting the accuracy of nanoparticle shape and size measurement in 3DMisa Hayashida, Kai Cui, Darren Homeniuk, et al.
Pageof 3

Showing results (11-20 of 30) with videos related to

Sort By:
Pageof 3
Micron (Oxford, England : 1993)|September 30, 2022
Origin of spurious intensity in vacuum near sample edge in bright field TEM imagesMisa Hayashida, Marek Malac, Jun Yamasaki
The Review of Scientific Instruments|November 4, 2011
Calibration method of tilt and azimuth angles for alignment of TEM tomographic tilt seriesMisa Hayashida, Shinya Terauchi, Toshiyuki Fujimoto
Micron (Oxford, England : 1993)|October 19, 2006
Development of computer-assisted minimal-dose system with beam blanker for TEMMisa Hayashida, Tsunenori Nomaguchi, Yoshihide Kimura, et al.
Ultramicroscopy|March 3, 2018
Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEMMisa Hayashida, Kai Cui, Marek Malac, et al.
Micron (Oxford, England : 1993)|May 1, 2012
Position-controlled marker formation by helium ion microscope for aligning a TEM tomographic tilt seriesMisa Hayashida, Tomohiko Iijima, Toshiyuki Fujimoto, et al.
Ultramicroscopy|May 20, 2014
Nano-dot markers for electron tomography formed by electron beam-induced deposition: nanoparticle agglomerates applicationMisa Hayashida, Marek Malac, Michael Bergen, et al.
Micron (Oxford, England : 1993)|September 21, 2019
3D observation of chromosome scaffold structure using a 360° electron tomography sample holderRinyaporn Phengchat, Misa Hayashida, Nobuko Ohmido, et al.
The Review of Scientific Instruments|September 1, 2014
Accurate measurement of relative tilt and azimuth angles in electron tomography: a comparison of fiducial marker method with electron diffractionMisa Hayashida, Marek Malac, Michael Bergen, et al.
Nanotechnology|July 2, 2024
3D imaging photocatalytically degraded micro- and nanoplasticsAleksander Cholewinski, Joseph Wortman, Misa Hayashida, et al.
Micron (Oxford, England : 1993)|May 31, 2019
Parameters affecting the accuracy of nanoparticle shape and size measurement in 3DMisa Hayashida, Kai Cui, Darren Homeniuk, et al.
Pageof 3