Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Mourad Idir

Showing results (11-20 of 50) with videos related to

Pageof 5
Sort By:
Optics Express|April 26, 2017
One-dimensional stitching interferometry assisted by a triple-beam interferometerJunpeng Xue, Lei Huang, Bo Gao, et al.
Journal of Synchrotron Radiation|September 3, 2020
Genuine-field modeling of partially coherent X-ray imaging systemsAntonie Verhoeven, Christian Hellmann, Frank Wyrowski, et al.
Optics Express|June 21, 2012
Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approachPeng Su, Yuhao Wang, James H Burge, et al.
Optics Express|November 10, 2016
Modal phase measuring deflectometryLei Huang, Junpeng Xue, Bo Gao, et al.
Optics Express|February 4, 2017
Model mismatch analysis and compensation for modal phase measuring deflectometryLei Huang, Junpeng Xue, Bo Gao, et al.
Optics Express|September 7, 2018
Two-dimensional stitching interferometry based on tilt measurementLei Huang, Mourad Idir, Chao Zuo, et al.
Optics Express|July 10, 2012
NbC/Si multilayer mirror for next generation EUV light sourcesMohammed H Modi, S K Rai, Mourad Idir, et al.
Optics Express|June 6, 2019
Study on an effective one-dimensional ion-beam figuring methodTianyi Wang, Lei Huang, Matthew Vescovi, et al.
Optics Express|August 6, 2020
Multi-pitch self-calibration measurement using a nano-accuracy surface profiler for X-ray mirror metrologyLei Huang, Tianyi Wang, Josep Nicolas, et al.
Optics Express|November 11, 2022
Simulation of X-ray Hartmann wavefront sensing with the Synchrotron Radiation WorkshopLei Huang, Tianyi Wang, Oleg Chubar, et al.
Pageof 5

Showing results (11-20 of 50) with videos related to

Sort By:
Pageof 5
Optics Express|April 26, 2017
One-dimensional stitching interferometry assisted by a triple-beam interferometerJunpeng Xue, Lei Huang, Bo Gao, et al.
Journal of Synchrotron Radiation|September 3, 2020
Genuine-field modeling of partially coherent X-ray imaging systemsAntonie Verhoeven, Christian Hellmann, Frank Wyrowski, et al.
Optics Express|June 21, 2012
Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approachPeng Su, Yuhao Wang, James H Burge, et al.
Optics Express|November 10, 2016
Modal phase measuring deflectometryLei Huang, Junpeng Xue, Bo Gao, et al.
Optics Express|February 4, 2017
Model mismatch analysis and compensation for modal phase measuring deflectometryLei Huang, Junpeng Xue, Bo Gao, et al.
Optics Express|September 7, 2018
Two-dimensional stitching interferometry based on tilt measurementLei Huang, Mourad Idir, Chao Zuo, et al.
Optics Express|July 10, 2012
NbC/Si multilayer mirror for next generation EUV light sourcesMohammed H Modi, S K Rai, Mourad Idir, et al.
Optics Express|June 6, 2019
Study on an effective one-dimensional ion-beam figuring methodTianyi Wang, Lei Huang, Matthew Vescovi, et al.
Optics Express|August 6, 2020
Multi-pitch self-calibration measurement using a nano-accuracy surface profiler for X-ray mirror metrologyLei Huang, Tianyi Wang, Josep Nicolas, et al.
Optics Express|November 11, 2022
Simulation of X-ray Hartmann wavefront sensing with the Synchrotron Radiation WorkshopLei Huang, Tianyi Wang, Oleg Chubar, et al.
Pageof 5