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N M Bashara

Showing results (1-10 of 13) with videos related to

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Applied Optics|February 2, 2010
Analogy between linear optical systems and linear two-port electrical networksR M Azzam, N M Bashara
Applied Optics|March 18, 2010
Optical properties of Zircaloy and Zircaloy oxide by ellipsometryN M Bashara, Y K Peng
Applied Optics|February 20, 2010
In process ellipsometer azimuth angle calibrationJ R Adams, N M Bashara
Applied Optics|March 25, 2010
Parameter correlation and precision in multiple-angle ellipsometryG H Bu-Abbud, N M Bashara
Applied Optics|February 4, 2010
Loci of invariant-azimuth and invariant-ellipticity polarization States of an optical systemR M Azzam, N M Bashara
Applied Optics|February 4, 2010
Parametric equation for the locus of invariant-ellipticity States of an optical systemR M Azzam, N M Bashara
Applied Optics|March 25, 2010
Optimizing null ellipsometry for oxidized siliconG H Bu-Abbud, N M Bashara
Applied Optics|February 6, 2010
Beam deviation errors in ellipsometric measurements; an analysisJ R Zeidler, R B Kohles, N M Bashara
Applied Optics|February 16, 2010
Combined reflection and transmission thin-film ellipsometry: a unified linear analysisR M Azzam, M Elshazly-Zaghloul, N M Bashara
Applied Optics|February 4, 2010
Trajectories describing the evolution of polarized light in homogeneous anisotropic media and liquid crystalsR M Azzam, B E Merrill, N M Bashara
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Applied Optics|February 2, 2010
Analogy between linear optical systems and linear two-port electrical networksR M Azzam, N M Bashara
Applied Optics|March 18, 2010
Optical properties of Zircaloy and Zircaloy oxide by ellipsometryN M Bashara, Y K Peng
Applied Optics|February 20, 2010
In process ellipsometer azimuth angle calibrationJ R Adams, N M Bashara
Applied Optics|March 25, 2010
Parameter correlation and precision in multiple-angle ellipsometryG H Bu-Abbud, N M Bashara
Applied Optics|February 4, 2010
Loci of invariant-azimuth and invariant-ellipticity polarization States of an optical systemR M Azzam, N M Bashara
Applied Optics|February 4, 2010
Parametric equation for the locus of invariant-ellipticity States of an optical systemR M Azzam, N M Bashara
Applied Optics|March 25, 2010
Optimizing null ellipsometry for oxidized siliconG H Bu-Abbud, N M Bashara
Applied Optics|February 6, 2010
Beam deviation errors in ellipsometric measurements; an analysisJ R Zeidler, R B Kohles, N M Bashara
Applied Optics|February 16, 2010
Combined reflection and transmission thin-film ellipsometry: a unified linear analysisR M Azzam, M Elshazly-Zaghloul, N M Bashara
Applied Optics|February 4, 2010
Trajectories describing the evolution of polarized light in homogeneous anisotropic media and liquid crystalsR M Azzam, B E Merrill, N M Bashara
Pageof 2