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P D Nellist

Showing results (1-10 of 27) with videos related to

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Journal of Microscopy|March 13, 2014
Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscopeL Jones, P D Nellist
Ultramicroscopy|February 20, 2007
A Bloch wave analysis of optical sectioning in aberration-corrected STEME C Cosgriff, P D Nellist
Journal of Electron Microscopy|July 27, 2001
On the origin of transverse incoherence in Z-contrast STEMB Rafferty, P D Nellist, S J Pennycook
Journal of Microscopy|January 10, 2018
An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-fieldL Jones, A Varambhia, H Sawada, et al.
Micron (Oxford, England : 1993)|August 5, 2003
Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectraI Arslan, S Ogut, P D Nellist, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscopeP D Nellist, E C Cosgriff, G Behan, et al.
Ultramicroscopy|July 17, 2012
Nanohalos: a manifestation of electron channelling in gold nanoparticlesG Ruben, P Wang, A J D'Alfonso, et al.
Ultramicroscopy|July 23, 2003
Towards sub-0.5 A electron beamsO L Krivanek, P D Nellist, N Dellby, et al.
Journal of Electron Microscopy|July 27, 2001
Progress in aberration-corrected scanning transmission electron microscopyN Dellby, O L Krivanek, P D Nellist, et al.
Ultramicroscopy|May 11, 2015
Optimal ADF STEM imaging parameters for tilt-robust image quantificationK E MacArthur, A J D'Alfonso, D Ozkaya, et al.
Pageof 3

Showing results (1-10 of 27) with videos related to

Sort By:
Pageof 3
Journal of Microscopy|March 13, 2014
Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscopeL Jones, P D Nellist
Ultramicroscopy|February 20, 2007
A Bloch wave analysis of optical sectioning in aberration-corrected STEME C Cosgriff, P D Nellist
Journal of Electron Microscopy|July 27, 2001
On the origin of transverse incoherence in Z-contrast STEMB Rafferty, P D Nellist, S J Pennycook
Journal of Microscopy|January 10, 2018
An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-fieldL Jones, A Varambhia, H Sawada, et al.
Micron (Oxford, England : 1993)|August 5, 2003
Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectraI Arslan, S Ogut, P D Nellist, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscopeP D Nellist, E C Cosgriff, G Behan, et al.
Ultramicroscopy|July 17, 2012
Nanohalos: a manifestation of electron channelling in gold nanoparticlesG Ruben, P Wang, A J D'Alfonso, et al.
Ultramicroscopy|July 23, 2003
Towards sub-0.5 A electron beamsO L Krivanek, P D Nellist, N Dellby, et al.
Journal of Electron Microscopy|July 27, 2001
Progress in aberration-corrected scanning transmission electron microscopyN Dellby, O L Krivanek, P D Nellist, et al.
Ultramicroscopy|May 11, 2015
Optimal ADF STEM imaging parameters for tilt-robust image quantificationK E MacArthur, A J D'Alfonso, D Ozkaya, et al.
Pageof 3