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The Review of Scientific Instruments|February 4, 2012
Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic propertiesMokrane Boudaoud, Yassine Haddab, Yann Le Gorrec, et al.The Review of Scientific Instruments|July 2, 2009
Quasistatic displacement self-sensing method for cantilevered piezoelectric actuatorsIoan Alexandru Ivan, Micky Rakotondrabe, Philippe Lutz, et al.The Review of Scientific Instruments|January 12, 2010
Current integration force and displacement self-sensing method for cantilevered piezoelectric actuatorsIoan Alexandru Ivan, Micky Rakotondrabe, Philippe Lutz, et al.Sensors (Basel, Switzerland)|June 9, 2019
Optimal Design of Piezoelectric Cantilevered Actuators for Charge-Based Self-Sensing ApplicationsJoël Bafumba Liseli, Joël Agnus, Philippe Lutz, et al.The Review of Scientific Instruments|May 3, 2015
Influence of mechanical noise inside a scanning electron microscopeMarcelo Gaudenzi de Faria, Yassine Haddab, Yann Le Gorrec, et al.Sensors (Basel, Switzerland)|September 28, 2021
A Two-Axis Piezoresistive Force Sensing Tool for MicrogrippingBhawnath Tiwari, Margot Billot, Cédric Clévy, et al.Optics Express|April 1, 2020
Real-time Lissajous imaging with a low-voltage 2-axis MEMS scanner based on electrothermal actuationQuentin A A Tanguy, Olivier Gaiffe, Nicolas Passilly, et al.Pageof 1