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Rajshekhar Gannavarpu

Showing results (1-10 of 12) with videos related to

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Applied Optics|October 18, 2022
Multiple phase extraction using graphics processing unit assisted unitary transformation method in digital holographic interferometryJagadesh Ramaiah, Rajshekhar Gannavarpu
Applied Optics|November 22, 2021
Dynamic displacement measurement in digital holographic interferometry using eigenspace analysisJagadesh Ramaiah, Rajshekhar Gannavarpu
Applied Optics|March 17, 2026
Precision surface metrology using a rapid optimization method in diffraction phase microscopySubrahmanya Keremane Narayan, Rajshekhar Gannavarpu
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|May 3, 2023
Quantitative phase gradient metrology using diffraction phase microscopy and deep learningAllaparthi Venkata Satya Vithin, Rajshekhar Gannavarpu
Applied Optics|July 2, 2020
Dynamic noncontact surface profilometry using a fast eigenspace method in diffraction phase microscopySreeprasad Ajithaprasad, Jagadesh Ramaiah, Rajshekhar Gannavarpu
Applied Optics|March 10, 2021
Demodulation of noisy interferograms with rapid phase variations and amplitude fluctuations using a surrogate principle-based optimization methodAllaparthi Venkata Satya Vithin, Ankur Vishnoi, Rajshekhar Gannavarpu
Plos One|November 12, 2014
Spatiotemporal characterization of a fibrin clot using quantitative phase imagingRajshekhar Gannavarpu, Basanta Bhaduri, Krishnarao Tangella, et al.
Applied Optics|June 18, 2021
Automated defect identification from carrier fringe patterns using Wigner-Ville distribution and a machine learning-based methodAnkur Vishnoi, Aditya Madipadaga, Sreeprasad Ajithaprasad, et al.
Applied Optics|April 26, 2022
Phase derivative estimation in digital holographic interferometry using a deep learning approachAllaparthi Venkata Satya Vithin, Ankur Vishnoi, Rajshekhar Gannavarpu
Applied Optics|September 14, 2023
Deep learning assisted non-contact defect identification method using diffraction phase microscopySubrahmanya Keremane Narayan, Allaparthi Venkata Satya Vithin, Rajshekhar Gannavarpu
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
Applied Optics|October 18, 2022
Multiple phase extraction using graphics processing unit assisted unitary transformation method in digital holographic interferometryJagadesh Ramaiah, Rajshekhar Gannavarpu
Applied Optics|November 22, 2021
Dynamic displacement measurement in digital holographic interferometry using eigenspace analysisJagadesh Ramaiah, Rajshekhar Gannavarpu
Applied Optics|March 17, 2026
Precision surface metrology using a rapid optimization method in diffraction phase microscopySubrahmanya Keremane Narayan, Rajshekhar Gannavarpu
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|May 3, 2023
Quantitative phase gradient metrology using diffraction phase microscopy and deep learningAllaparthi Venkata Satya Vithin, Rajshekhar Gannavarpu
Applied Optics|July 2, 2020
Dynamic noncontact surface profilometry using a fast eigenspace method in diffraction phase microscopySreeprasad Ajithaprasad, Jagadesh Ramaiah, Rajshekhar Gannavarpu
Applied Optics|March 10, 2021
Demodulation of noisy interferograms with rapid phase variations and amplitude fluctuations using a surrogate principle-based optimization methodAllaparthi Venkata Satya Vithin, Ankur Vishnoi, Rajshekhar Gannavarpu
Plos One|November 12, 2014
Spatiotemporal characterization of a fibrin clot using quantitative phase imagingRajshekhar Gannavarpu, Basanta Bhaduri, Krishnarao Tangella, et al.
Applied Optics|June 18, 2021
Automated defect identification from carrier fringe patterns using Wigner-Ville distribution and a machine learning-based methodAnkur Vishnoi, Aditya Madipadaga, Sreeprasad Ajithaprasad, et al.
Applied Optics|April 26, 2022
Phase derivative estimation in digital holographic interferometry using a deep learning approachAllaparthi Venkata Satya Vithin, Ankur Vishnoi, Rajshekhar Gannavarpu
Applied Optics|September 14, 2023
Deep learning assisted non-contact defect identification method using diffraction phase microscopySubrahmanya Keremane Narayan, Allaparthi Venkata Satya Vithin, Rajshekhar Gannavarpu
Pageof 2