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Nano Letters|October 16, 2010
Standardless atom counting in scanning transmission electron microscopyJames M LeBeau, Scott D Findlay, Leslie J Allen, et al.Physical Review Letters|June 4, 2008
Quantitative atomic resolution scanning transmission electron microscopyJames M LeBeau, Scott D Findlay, Leslie J Allen, et al.Nature|February 10, 2022
Real-space visualization of intrinsic magnetic fields of an antiferromagnetYuji Kohno, Takehito Seki, Scott D Findlay, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2020
Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast ImagingBudhika G Mendis, Juri Barthel, Scott D Findlay, et al.Ultramicroscopy|November 27, 2009
Position averaged convergent beam electron diffraction: theory and applicationsJames M Lebeau, Scott D Findlay, Leslie J Allen, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 31, 2013
Quantitative annular dark field electron microscopy using single electron signalsRyo Ishikawa, Andrew R Lupini, Scott D Findlay, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2014
Practical aspects of removing the effects of elastic and thermal diffuse scattering from spectroscopic data for single crystalsNathan R Lugg, Melissa J Neish, Scott D Findlay, et al.Ultramicroscopy|August 7, 2017
Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantificationKatherine E MacArthur, Hamish G Brown, Scott D Findlay, et al.Plos One|April 19, 2016
A Digital PCR-Based Method for Efficient and Highly Specific Screening of Genome Edited CellsScott D Findlay, Krista M Vincent, Jennifer R Berman, et al.Journal of Electron Microscopy|April 22, 2010
New area detector for atomic-resolution scanning transmission electron microscopyNaoya Shibata, Yuji Kohno, Scott D Findlay, et al.Pageof 8