Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Stanislav Tereschenko

Showing results (1-10 of 5) with videos related to

Pageof 1
Sort By:
Optics Express|April 4, 2018
Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limitPeter Lehmann, Weichang Xie, Benedikt Allendorf, et al.
Optics Express|June 6, 2019
Temporal high-resolution evaluation algorithm for sinusoidally phase modulated interference signalsStanislav Tereschenko, Marcel Dissemond, Kevin Weinke, et al.
Optics Express|July 14, 2016
Signal modeling in low coherence interference microscopy on example of rectangular gratingWeichang Xie, Peter Lehmann, Jan Niehues, et al.
Applied Optics|August 19, 2016
Passive vibration compensation in scanning white-light interferometryStanislav Tereschenko, Peter Lehmann, Lisa Zellmer, et al.
Optics Express|August 9, 2017
System spectrum conversion from white light interferogramRisto Montonen, Anton Nolvi, Stanislav Tereschenko, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Optics Express|April 4, 2018
Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limitPeter Lehmann, Weichang Xie, Benedikt Allendorf, et al.
Optics Express|June 6, 2019
Temporal high-resolution evaluation algorithm for sinusoidally phase modulated interference signalsStanislav Tereschenko, Marcel Dissemond, Kevin Weinke, et al.
Optics Express|July 14, 2016
Signal modeling in low coherence interference microscopy on example of rectangular gratingWeichang Xie, Peter Lehmann, Jan Niehues, et al.
Applied Optics|August 19, 2016
Passive vibration compensation in scanning white-light interferometryStanislav Tereschenko, Peter Lehmann, Lisa Zellmer, et al.
Optics Express|August 9, 2017
System spectrum conversion from white light interferogramRisto Montonen, Anton Nolvi, Stanislav Tereschenko, et al.
Pageof 1