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Stuart I Wright
Matthew M Nowell
David P Field

Showing results (1-10 of 15) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2011
A review of strain analysis using electron backscatter diffractionStuart I Wright, Matthew M Nowell, David P Field
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
EBSD image quality mappingStuart I Wright, Matthew M Nowell
Ultramicroscopy|March 22, 2005
Orientation effects on indexing of electron backscatter diffraction patternsMatthew M Nowell, Stuart I Wright
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 1, 2014
Orientation precision of electron backscatter diffraction measurements near grain boundariesStuart I Wright, Matthew M Nowell, René de Kloe, et al.
Ultramicroscopy|December 3, 2014
Electron imaging with an EBSD detectorStuart I Wright, Matthew M Nowell, René de Kloe, et al.
Ultramicroscopy|September 7, 2015
Introduction and comparison of new EBSD post-processing methodologiesStuart I Wright, Matthew M Nowell, Scott P Lindeman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 28, 2019
Reflector Selection for the Indexing of Electron Backscatter Diffraction PatternsStuart I Wright, Saransh Singh, Marc De Graef
Ultramicroscopy|March 3, 2019
NLPAR: Non-local smoothing for enhanced EBSD pattern indexingPatrick T Brewick, Stuart I Wright, David J Rowenhorst
Ultramicroscopy|December 3, 2014
3D image reconstruction of fiber systems using electron tomographyOsama M Fakron, David P Field
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 20, 2016
Phase Identification of Dual-Phase (DP980) Steels by Electron Backscatter Diffraction and Nanoindentation TechniquesFan Zhang, Annie Ruimi, David P Field
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2011
A review of strain analysis using electron backscatter diffractionStuart I Wright, Matthew M Nowell, David P Field
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
EBSD image quality mappingStuart I Wright, Matthew M Nowell
Ultramicroscopy|March 22, 2005
Orientation effects on indexing of electron backscatter diffraction patternsMatthew M Nowell, Stuart I Wright
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 1, 2014
Orientation precision of electron backscatter diffraction measurements near grain boundariesStuart I Wright, Matthew M Nowell, René de Kloe, et al.
Ultramicroscopy|December 3, 2014
Electron imaging with an EBSD detectorStuart I Wright, Matthew M Nowell, René de Kloe, et al.
Ultramicroscopy|September 7, 2015
Introduction and comparison of new EBSD post-processing methodologiesStuart I Wright, Matthew M Nowell, Scott P Lindeman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 28, 2019
Reflector Selection for the Indexing of Electron Backscatter Diffraction PatternsStuart I Wright, Saransh Singh, Marc De Graef
Ultramicroscopy|March 3, 2019
NLPAR: Non-local smoothing for enhanced EBSD pattern indexingPatrick T Brewick, Stuart I Wright, David J Rowenhorst
Ultramicroscopy|December 3, 2014
3D image reconstruction of fiber systems using electron tomographyOsama M Fakron, David P Field
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 20, 2016
Phase Identification of Dual-Phase (DP980) Steels by Electron Backscatter Diffraction and Nanoindentation TechniquesFan Zhang, Annie Ruimi, David P Field
Pageof 2