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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 18, 2020
Development of a Practicable Digital Pulse Read-Out for Dark-Field STEMTiarnan Mullarkey, Clive Downing, Lewys JonesMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
Interlacing in Atomic Resolution Scanning Transmission Electron MicroscopyJonathan J P Peters, Tiarnan Mullarkey, James A Gott, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron MicroscopeFrances Quigley, Clive Downing, Cormac McGuinness, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
How Fast is Your Detector? The Effect of Temporal Response on Image QualityTiarnan Mullarkey, Matthew Geever, Jonathan J P Peters, et al.Ultramicroscopy|September 28, 2024
On the temporal transfer function in STEM imaging from finite detector response timeJonathan J P Peters, Tiarnan Mullarkey, Julie Marie Bekkevold, et al.Nature Communications|August 25, 2023
Electron counting detectors in scanning transmission electron microscopy via hardware signal processingJonathan J P Peters, Tiarnan Mullarkey, Emma Hedley, et al.ACS Omega|January 16, 2023
Templated Synthesis of SiO<sub>2</sub> Nanotubes for Lithium-Ion Battery Applications: An In Situ (Scanning) Transmission Electron Microscopy StudyOskar Ronan, Ahin Roy, Sean Ryan, et al.Ultramicroscopy|June 17, 2024
New Poisson denoising method for pulse-count STEM imagingTaichi Kusumi, Shun Katakami, Ryo Ishikawa, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D NellistMicron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D NellistPageof 7