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Toshiaki Tanigaki

Showing results (1-10 of 34) with videos related to

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Micron (Oxford, England : 1993)|September 20, 2025
Quantitative and three-dimensional observations by electron holographyToshiaki Tanigaki
Microscopy (Oxford, England)|June 29, 2025
Reduction of Membrane-derived Noise Using Beam-tilt Measurement and Deep Learning in Observation using Environmental CellFumiaki Ichihashi, Yoshio Takahashi, Toshiaki Tanigaki
Microscopy (Oxford, England)|September 29, 2020
Holography: application to high-resolution imagingTakeshi Kawasaki, Yoshio Takahashi, Toshiaki Tanigaki
Microscopy (Oxford, England)|February 4, 2023
Resolution does matterRyo Ishikawa, Toshiaki Tanigaki, Yoshiyuki Fukuda
Microscopy (Oxford, England)|January 18, 2024
Removal of phase residues in electron holographyYoshio Takahashi, Tetsuya Akashi, Toshiaki Tanigaki
Advanced Materials (Deerfield Beach, Fla.)|November 19, 2016
Advanced Electron Holography Applied to Electromagnetic Field Study in Materials ScienceDaisuke Shindo, Toshiaki Tanigaki, Hyun Soon Park
Microscopy (Oxford, England)|March 29, 2024
High-precision charge analysis in a catalytic nanoparticle by electron holographyRyotaro Aso, Yoshihiro Midoh, Toshiaki Tanigaki, et al.
Journal of Electron Microscopy|October 15, 2010
Three-dimensional evaluation of an independent multi-walled carbon nanotube probe by tomography with high-resolution transmission electron microscopeToshiaki Tanigaki, Kishio Hidaka, Motoyuki Hirooka, et al.
Journal of Electron Microscopy|December 23, 2011
Three-dimensional reconstructions of electrostatic potential distributions with 1.5-nm resolution using off-axis electron holographyToshiaki Tanigaki, Shinji Aizawa, Takahiro Suzuki, et al.
Microscopy (Oxford, England)|September 12, 2022
Spatial and phase resolution in electron microscopyRyo Ishikawa, Shigeyuki Morishita, Toshiaki Tanigaki, et al.
Pageof 4

Showing results (1-10 of 34) with videos related to

Sort By:
Pageof 4
Micron (Oxford, England : 1993)|September 20, 2025
Quantitative and three-dimensional observations by electron holographyToshiaki Tanigaki
Microscopy (Oxford, England)|June 29, 2025
Reduction of Membrane-derived Noise Using Beam-tilt Measurement and Deep Learning in Observation using Environmental CellFumiaki Ichihashi, Yoshio Takahashi, Toshiaki Tanigaki
Microscopy (Oxford, England)|September 29, 2020
Holography: application to high-resolution imagingTakeshi Kawasaki, Yoshio Takahashi, Toshiaki Tanigaki
Microscopy (Oxford, England)|February 4, 2023
Resolution does matterRyo Ishikawa, Toshiaki Tanigaki, Yoshiyuki Fukuda
Microscopy (Oxford, England)|January 18, 2024
Removal of phase residues in electron holographyYoshio Takahashi, Tetsuya Akashi, Toshiaki Tanigaki
Advanced Materials (Deerfield Beach, Fla.)|November 19, 2016
Advanced Electron Holography Applied to Electromagnetic Field Study in Materials ScienceDaisuke Shindo, Toshiaki Tanigaki, Hyun Soon Park
Microscopy (Oxford, England)|March 29, 2024
High-precision charge analysis in a catalytic nanoparticle by electron holographyRyotaro Aso, Yoshihiro Midoh, Toshiaki Tanigaki, et al.
Journal of Electron Microscopy|October 15, 2010
Three-dimensional evaluation of an independent multi-walled carbon nanotube probe by tomography with high-resolution transmission electron microscopeToshiaki Tanigaki, Kishio Hidaka, Motoyuki Hirooka, et al.
Journal of Electron Microscopy|December 23, 2011
Three-dimensional reconstructions of electrostatic potential distributions with 1.5-nm resolution using off-axis electron holographyToshiaki Tanigaki, Shinji Aizawa, Takahiro Suzuki, et al.
Microscopy (Oxford, England)|September 12, 2022
Spatial and phase resolution in electron microscopyRyo Ishikawa, Shigeyuki Morishita, Toshiaki Tanigaki, et al.
Pageof 4