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Optics Express|November 23, 2021
Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopyV Prabhakara, T Nuytten, H Bender, et al.Ultramicroscopy|September 8, 2020
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscaleV Prabhakara, D Jannis, G Guzzinati, et al.Journal of Microscopy|November 6, 2010
Characterization of nickel silicides using EELS-based methodsE Verleysen, H Bender, O Richard, et al.Ultramicroscopy|March 16, 2017
X-ray absorption in pillar shaped transmission electron microscopy specimensH Bender, F Seidel, P Favia, et al.Ultramicroscopy|August 26, 2011
Exploring different inelastic projection mechanisms for electron tomographyB Goris, S Bals, W Van den Broek, et al.Ultramicroscopy|June 2, 2006
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic imagesM D Croitoru, D Van Dyck, S Van Aert, et al.The Journal of Chemical Physics|February 10, 2017
Nucleation and growth mechanisms of Al2O3 atomic layerdeposition on synthetic polycrystalline MoS2H Zhang, D Chiappe, J Meersschaut, et al.Nano Letters|May 17, 2013
Direct imaging of 3D atomic-scale dopant-defect clustering processes in ion-implanted siliconS Koelling, O Richard, H Bender, et al.Ultramicroscopy|June 16, 2009
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopyS Van Aert, J Verbeeck, R Erni, et al.Ultramicroscopy|January 24, 2009
Failure mechanisms of silicon-based atom-probe tipsS Kölling, W VandervorstPageof 31