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Ultramicroscopy|August 27, 2022
Exploration of atom probe tomography at sub-10KAlec C Day, Andrew J Breen, David A Reinhard, et al.Ultramicroscopy|November 3, 2022
Complementary ADF-STEM: a Flexible Approach to Quantitative 4D-STEMBryan D Esser, Joanne EtheridgeUltramicroscopy|June 11, 2023
Temporal coherence envelope function of field emission in electron microscopyXuan Tan Nguyen, Michael S AltmanUltramicroscopy|June 10, 2023
Multi-scale time-resolved electron diffraction: A case study in moiré materialsC J R Duncan, M Kaemingk, W H Li, et al.Ultramicroscopy|June 13, 2003
Optimisation of sample preparation methods for air imaging of ocular mucins by AFMDebra J Brayshaw, Monica Berry, Terence J McMasterUltramicroscopy|October 11, 2005
Improving immunoassays based on the analysis of scanning force microscopy imagesG Roe, L McDonnellUltramicroscopy|June 20, 2026
Contamination analysis of the residual gas composition in transmission electron microscopyJulia Menten, Stephan Kujawa, Robert Schlögl, et al.Ultramicroscopy|June 18, 2026
Towards reliable electrical measurements of superconducting devices inside a transmission electron microscopeJoachim Dahl Thomsen, Michael I Faley, Joseph Vimal Vas, et al.Ultramicroscopy|July 1, 2026
Predictive drift compensation of multi-frame STEM via live scan modificationMatthew Mosse, Jonathan J P Peters, Eoin Moynihan, et al.Ultramicroscopy|July 12, 2008
AFM analysis of anisotropic dissolution in dense hydroxyapatiteDong Seok Seo, Jong Kook LeePageof 458