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Ultramicroscopy|May 29, 2017
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?M Alania, A De Backer, I Lobato, et al.Ultramicroscopy|September 2, 2016
Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrodeK Bücker, M Picher, O Crégut, et al.Ultramicroscopy|January 1, 2017
An electron energy loss spectrometer based streak camera for time resolved TEM measurementsHasan Ali, Johan Eriksson, Hu Li, et al.Ultramicroscopy|February 8, 2018
Image feature delocalization in defocused probe electron ptychographyS Cao, A M Maiden, J M RodenburgUltramicroscopy|January 12, 2018
Determination of atomic positions from time resolved high resolution transmission electron microscopy imagesZahra Hussaini, Pin Ann Lin, Bharath Natarajan, et al.Ultramicroscopy|June 25, 2019
On the depth resolution of transmission Kikuchi diffraction (TKD) analysisJunliang Liu, Sergio Lozano-Perez, Angus J Wilkinson, et al.Ultramicroscopy|January 25, 2021
Complementary LEEM and eV-TEM for imaging and spectroscopyPeter S Neu, Daniël Geelen, Aniket Thete, et al.Ultramicroscopy|July 31, 2020
Transmission imaging on a scintillator in a scanning electron microscopeWilco Zuidema, Pieter KruitUltramicroscopy|June 20, 2020
TEM bright field imaging of thick specimens: nodes in Thon ring patternsWillem Tichelaar, Wim J H Hagen, Tatiana E Gorelik, et al.Ultramicroscopy|June 15, 2020
Influence of experimental conditions on localized surface plasmon resonances measurement by electron energy loss spectroscopyMichal Horák, Tomáš ŠikolaPageof 460