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Ultramicroscopy|September 22, 2017
Picometer-scale atom position analysis in annular bright-field STEM imagingPeng Gao, Akihito Kumamoto, Ryo Ishikawa, et al.Ultramicroscopy|September 15, 2017
Overcoming the drawbacks of plastic strain estimation based on KAMRickard R Shen, Pål EfsingUltramicroscopy|August 30, 2017
Developing an in situ environmental TEM set up for investigations of resistive switching mechanisms in Pt-Pr1-xCaxMnO3-δ-Pt sandwich structuresThilo Kramer, Daniel Mierwaldt, Malte Scherff, et al.Ultramicroscopy|September 10, 2017
Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffractionBret E Dunlap, Timothy J Ruggles, David T Fullwood, et al.Ultramicroscopy|July 15, 2017
Aberration measurement of the probe-forming system of an electron microscope using two-dimensional materialsHidetaka Sawada, Christopher S Allen, Shanshan Wang, et al.Ultramicroscopy|March 4, 2016
Prospects for electron beam aberration correction using sculpted phase masksRoy Shiloh, Roei Remez, Ady ArieUltramicroscopy|March 8, 2016
A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscopeW Xu, J H Dycus, X Sang, et al.Ultramicroscopy|November 10, 2015
Single atom spectroscopy: Decreased scattering delocalization at high energy losses, effects of atomic movement and X-ray fluorescence yieldLuiz H G Tizei, Yoko Iizumi, Toshiya Okazaki, et al.Ultramicroscopy|November 12, 2015
Theoretical estimates of spherical and chromatic aberration in photoemission electron microscopyJ P S Fitzgerald, R C Word, R KönenkampUltramicroscopy|November 23, 2015
Phase contrast STEM for thin samples: Integrated differential phase contrastIvan Lazić, Eric G T Bosch, Sorin LazarPageof 460