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Ultramicroscopy|March 4, 2016
Prospects for electron beam aberration correction using sculpted phase masksRoy Shiloh, Roei Remez, Ady ArieUltramicroscopy|March 8, 2016
A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscopeW Xu, J H Dycus, X Sang, et al.Ultramicroscopy|November 10, 2015
Single atom spectroscopy: Decreased scattering delocalization at high energy losses, effects of atomic movement and X-ray fluorescence yieldLuiz H G Tizei, Yoko Iizumi, Toshiya Okazaki, et al.Ultramicroscopy|November 12, 2015
Theoretical estimates of spherical and chromatic aberration in photoemission electron microscopyJ P S Fitzgerald, R C Word, R KönenkampUltramicroscopy|November 23, 2015
Phase contrast STEM for thin samples: Integrated differential phase contrastIvan Lazić, Eric G T Bosch, Sorin LazarUltramicroscopy|May 15, 2016
Angularly-selective transmission imaging in a scanning electron microscopeJason Holm, Robert R KellerUltramicroscopy|May 26, 2016
Efficient creation of electron vortex beams for high resolution STEM imagingA Béché, R Juchtmans, J VerbeeckUltramicroscopy|May 11, 2016
The role of transition radiation in cathodoluminescence imaging and spectroscopy of thin-foilsB G Mendis, A Howkins, D Stowe, et al.Ultramicroscopy|May 25, 2016
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopyKnut Müller-Caspary, Florian F Krause, Tim Grieb, et al.Ultramicroscopy|September 10, 2014
Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materialsG Van Eyndhoven, M Kurttepeli, C J Van Oers, et al.Pageof 458