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Ultramicroscopy

Showing results (221-230 of 4,742) with videos related to

Pageof 475
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Ultramicroscopy|June 4, 2013
A distinguished trio, introduction to the Saxton-Smith-Van Dyck 65th-birthday issueP W Hawkes
Ultramicroscopy|May 16, 2013
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holographyA Béché, J L Rouvière, J P Barnes, et al.
Ultramicroscopy|April 11, 2013
LEEM image phase contrast of MnAs stripesA B Pang, A Pavlovska, L Däweritz, et al.
Ultramicroscopy|March 30, 2013
Mapping energetics of atom probe evaporation events through first principles calculationsJoaquín Peralta, Scott R Broderick, Krishna Rajan
Ultramicroscopy|July 23, 2013
Quantitative electron tomography: the effect of the three-dimensional point spread functionHamed Heidari, Wouter Van den Broek, Sara Bals
Ultramicroscopy|July 23, 2013
High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopyShaoxia Chen, Greg McMullan, Abdul R Faruqi, et al.
Ultramicroscopy|July 23, 2013
Simulating realistic imaging conditions for in situ liquid microscopyDavid A Welch, Roland Faller, James E Evans, et al.
Ultramicroscopy|July 23, 2013
Backscattered electron imaging at low emerging angles: a physical approach to contrast in LVSEMJ Cazaux, N Kuwano, K Sato
Ultramicroscopy|July 23, 2013
A new correlation based alignment technique for use in electron tomographyS D Jones, M Härting
Ultramicroscopy|July 31, 2013
Contrast in atomically resolved EF-SCEM imagingPeng Wang, Adrian J D'Alfonso, Ayako Hashimoto, et al.
Pageof 475

Showing results (221-230 of 4,742) with videos related to

Sort By:
Pageof 475
Ultramicroscopy|June 4, 2013
A distinguished trio, introduction to the Saxton-Smith-Van Dyck 65th-birthday issueP W Hawkes
Ultramicroscopy|May 16, 2013
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holographyA Béché, J L Rouvière, J P Barnes, et al.
Ultramicroscopy|April 11, 2013
LEEM image phase contrast of MnAs stripesA B Pang, A Pavlovska, L Däweritz, et al.
Ultramicroscopy|March 30, 2013
Mapping energetics of atom probe evaporation events through first principles calculationsJoaquín Peralta, Scott R Broderick, Krishna Rajan
Ultramicroscopy|July 23, 2013
Quantitative electron tomography: the effect of the three-dimensional point spread functionHamed Heidari, Wouter Van den Broek, Sara Bals
Ultramicroscopy|July 23, 2013
High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopyShaoxia Chen, Greg McMullan, Abdul R Faruqi, et al.
Ultramicroscopy|July 23, 2013
Simulating realistic imaging conditions for in situ liquid microscopyDavid A Welch, Roland Faller, James E Evans, et al.
Ultramicroscopy|July 23, 2013
Backscattered electron imaging at low emerging angles: a physical approach to contrast in LVSEMJ Cazaux, N Kuwano, K Sato
Ultramicroscopy|July 23, 2013
A new correlation based alignment technique for use in electron tomographyS D Jones, M Härting
Ultramicroscopy|July 31, 2013
Contrast in atomically resolved EF-SCEM imagingPeng Wang, Adrian J D'Alfonso, Ayako Hashimoto, et al.
Pageof 475