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Ultramicroscopy|July 23, 2013
High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopyShaoxia Chen, Greg McMullan, Abdul R Faruqi, et al.Ultramicroscopy|July 23, 2013
Simulating realistic imaging conditions for in situ liquid microscopyDavid A Welch, Roland Faller, James E Evans, et al.Ultramicroscopy|July 23, 2013
Backscattered electron imaging at low emerging angles: a physical approach to contrast in LVSEMJ Cazaux, N Kuwano, K SatoUltramicroscopy|July 23, 2013
A new correlation based alignment technique for use in electron tomographyS D Jones, M HärtingUltramicroscopy|July 31, 2013
Contrast in atomically resolved EF-SCEM imagingPeng Wang, Adrian J D'Alfonso, Ayako Hashimoto, et al.Ultramicroscopy|May 26, 2012
Capturing the signature of single atoms with the tiny probe of a STEMC Colliex, A Gloter, K March, et al.Ultramicroscopy|April 11, 2002
AFM imaging in solution of protein-DNA complexes formed on DNA anchored to a gold surfaceO Medalia, J Englander, R Guckenberger, et al.Ultramicroscopy|April 11, 2002
Measurement of the volume expansion of a grain boundary by the phase methodJ M Pénisson, T VystavelUltramicroscopy|April 11, 2002
Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulationU Weierstall, Q Chen, J C Spence, et al.Pageof 460