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Ultramicroscopy|November 12, 2003
CBED and LACBED: characterization of antiphase boundariesJ P Morniroli, M L Nó, P P Rodríguez, et al.Ultramicroscopy|June 26, 2019
A conducting atomic force microscopy study of conducting filament nanobits in the epitaxial NiO thin film prepared precisely controlled by the oxidation time of the single crystalline Ni substratesHyun Wook Shin, Jong Yeog SonUltramicroscopy|October 18, 2019
Cryo-EM sample preparation method for extremely low concentration liposomesLige Tonggu, Liguo WangUltramicroscopy|April 16, 2019
MicroED data collection with SerialEMM Jason de la Cruz, Michael W Martynowycz, Johan Hattne, et al.Ultramicroscopy|August 27, 2018
Complex evaporation behavior of a transition metal carbo-nitride (Hf(C,N)) studied by atom probe tomographyF Vogel, S Ngai, C J Smith, et al.Ultramicroscopy|August 27, 2018
The effect of scanning jitter on geometric phase analysis in STEM imagesJun Li, Shaobo Cheng, Lijun Wu, et al.Ultramicroscopy|April 28, 2019
Improved quantum efficiency and stability of GaAs photocathode using favorable illumination during activationCheng Feng, Yijun Zhang, Yunsheng Qian, et al.Ultramicroscopy|January 1, 1978
Structure analysis of small proteins by electron microscopy: valinomycin, bacitracin and low molecular weight cell growth stimulatorsF P Ottensmeyer, D P Bazett-Jones, J Hewitt, et al.Ultramicroscopy|September 22, 2018
A quasi in situ TEM grid reactor for decoupling catalytic gas phase reactions and analysisLiudmyla Masliuk, Manfred Swoboda, Gerardo Algara-Siller, et al.Ultramicroscopy|June 30, 2018
Interlayer electrical resistivity of rotated graphene layers studied by in-situ scanning electron microscopyHe Li, Xianlong Wei, Gongtao Wu, et al.Pageof 460