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Ultramicroscopy|September 21, 2019
Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross correlation on the sphereRalf Hielscher, Felix Bartel, Thomas Benjamin BrittonUltramicroscopy|January 17, 2021
High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patternsGregory Sparks, Paul A Shade, Michael D Uchic, et al.Ultramicroscopy|September 7, 2019
Analysis of depth-sectioning STEM for thick samples and 3D imagingEric G T Bosch, Ivan LazićUltramicroscopy|September 9, 2019
3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithmA A Borzunov, V Y Karaulov, N A Koshev, et al.Ultramicroscopy|September 11, 2019
A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patternsW C Lenthe, S Singh, M De GraefUltramicroscopy|August 11, 2019
Design and application of a relativistic Kramers-Kronig analysis algorithmAlberto Eljarrat, Christoph T KochUltramicroscopy|August 12, 2019
Nanosecond electron holography by interference gatingTolga Wagner, Tore Niermann, Felix Urban, et al.Ultramicroscopy|February 1, 2021
Defocus-dependent Thon-ring fadingRobert M Glaeser, Wim J H Hagen, Bong-Gyoon Han, et al.Ultramicroscopy|September 24, 2019
Influence of pixelization on height measurement in atomic force microscopyAnna P Tolstova, Evgeniy V DubrovinUltramicroscopy|July 17, 2019
Composition determination for quaternary III-V semiconductors by aberration-corrected STEMP Kükelhan, T Hepp, S Firoozabadi, et al.Pageof 460