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Ultramicroscopy
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June 16, 2009
Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy
Lin Gu, Wilfried Sigle, Christoph T Koch, et al.
Ultramicroscopy
|
June 23, 2009
Field-dependent electron emission patterns from individual SWCNTs simulated with a multi-scale algorithm
Weiliang Wang, Ningsheng Xu, Zhibing Li
Ultramicroscopy
|
June 23, 2009
Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector
G McMullan, A R Faruqi, R Henderson, et al.
Ultramicroscopy
|
August 8, 2009
A systematic approach to choosing parameters for modelling fine structure in electron energy-loss spectroscopy
Che R Seabourne, Andrew J Scott, Rik Brydson, et al.
Ultramicroscopy
|
September 15, 2009
Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization
P Rulis, A R Lupini, S J Pennycook, et al.
Ultramicroscopy
|
August 12, 2009
TEM sample preparation by FIB for carbon nanotube interconnects
Xiaoxing Ke, Sara Bals, Ainhoa Romo Negreira, et al.
Ultramicroscopy
|
August 12, 2009
The effect of surface strain relaxation on HAADF imaging
V Grillo
Ultramicroscopy
|
September 22, 2009
A model based atomic resolution tomographic algorithm
W Van den Broek, S Van Aert, D Van Dyck
Ultramicroscopy
|
April 13, 2010
Molecular recognition of DNA-protein complexes: a straightforward method combining scanning force and fluorescence microscopy
Humberto Sanchez, Roland Kanaar, Claire Wyman
Ultramicroscopy
|
May 4, 2010
Dynamics of annular bright field imaging in scanning transmission electron microscopy
S D Findlay, N Shibata, H Sawada, et al.
Page
of 458
Search research articles
Search
Showing results (701-710 of 4,574) with videos related to
Sort By:
Page
of 458
Ultramicroscopy
|
June 16, 2009
Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy
Lin Gu, Wilfried Sigle, Christoph T Koch, et al.
Ultramicroscopy
|
June 23, 2009
Field-dependent electron emission patterns from individual SWCNTs simulated with a multi-scale algorithm
Weiliang Wang, Ningsheng Xu, Zhibing Li
Ultramicroscopy
|
June 23, 2009
Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector
G McMullan, A R Faruqi, R Henderson, et al.
Ultramicroscopy
|
August 8, 2009
A systematic approach to choosing parameters for modelling fine structure in electron energy-loss spectroscopy
Che R Seabourne, Andrew J Scott, Rik Brydson, et al.
Ultramicroscopy
|
September 15, 2009
Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization
P Rulis, A R Lupini, S J Pennycook, et al.
Ultramicroscopy
|
August 12, 2009
TEM sample preparation by FIB for carbon nanotube interconnects
Xiaoxing Ke, Sara Bals, Ainhoa Romo Negreira, et al.
Ultramicroscopy
|
August 12, 2009
The effect of surface strain relaxation on HAADF imaging
V Grillo
Ultramicroscopy
|
September 22, 2009
A model based atomic resolution tomographic algorithm
W Van den Broek, S Van Aert, D Van Dyck
Ultramicroscopy
|
April 13, 2010
Molecular recognition of DNA-protein complexes: a straightforward method combining scanning force and fluorescence microscopy
Humberto Sanchez, Roland Kanaar, Claire Wyman
Ultramicroscopy
|
May 4, 2010
Dynamics of annular bright field imaging in scanning transmission electron microscopy
S D Findlay, N Shibata, H Sawada, et al.
Page
of 458