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Ultramicroscopy|June 16, 2009
Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopyLin Gu, Wilfried Sigle, Christoph T Koch, et al.Ultramicroscopy|June 23, 2009
Field-dependent electron emission patterns from individual SWCNTs simulated with a multi-scale algorithmWeiliang Wang, Ningsheng Xu, Zhibing LiUltramicroscopy|June 23, 2009
Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detectorG McMullan, A R Faruqi, R Henderson, et al.Ultramicroscopy|August 8, 2009
A systematic approach to choosing parameters for modelling fine structure in electron energy-loss spectroscopyChe R Seabourne, Andrew J Scott, Rik Brydson, et al.Ultramicroscopy|September 15, 2009
Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualizationP Rulis, A R Lupini, S J Pennycook, et al.Ultramicroscopy|August 12, 2009
TEM sample preparation by FIB for carbon nanotube interconnectsXiaoxing Ke, Sara Bals, Ainhoa Romo Negreira, et al.Ultramicroscopy|September 22, 2009
A model based atomic resolution tomographic algorithmW Van den Broek, S Van Aert, D Van DyckUltramicroscopy|April 13, 2010
Molecular recognition of DNA-protein complexes: a straightforward method combining scanning force and fluorescence microscopyHumberto Sanchez, Roland Kanaar, Claire WymanUltramicroscopy|May 4, 2010
Dynamics of annular bright field imaging in scanning transmission electron microscopyS D Findlay, N Shibata, H Sawada, et al.Pageof 460