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Updated: Jul 3, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Trapped-dopant model of doping in semiconductor nanocrystals

Mao-Hua Du1, Steven C Erwin, Al L Efros

  • 1Center for Computational Materials Science, Naval Research Laboratory, Washington, D.C. 20375, USA.

Nano Letters
|August 6, 2008
PubMed

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