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High Pressure Single Crystal Diffraction at PX^2
Published on: January 16, 2017
X-ray diffraction in the pulsed laser heated diamond anvil cell.
Alexander F Goncharov1, Vitali B Prakapenka, Viktor V Struzhkin
1Geophysical Laboratory, Carnegie Institution of Washington, 5251 Broad Branch Rd., NW, Washington, DC 20015, USA.
The Review of Scientific Instruments
|December 8, 2010
Summary
Researchers developed a pulsed laser heating technique for in situ X-ray diffraction in a diamond anvil cell. This method allows precise temperature control for studying material properties under extreme pressure and temperature conditions.
Area of Science:
- High-pressure physics
- Materials science
- Synchrotron science
Background:
- In situ X-ray diffraction is crucial for studying materials under extreme conditions.
- Previous methods for laser heating in diamond anvil cells had limitations in temperature control and uniformity.
Purpose of the Study:
- To develop a novel pulsed laser heating technique for in situ X-ray diffraction.
- To achieve precise temperature control and uniformity in microsecond timescales at high pressures.
- To enable accurate measurements of melting curves, phase transitions, and thermal equations of state.
Main Methods:
- Utilized a pulsed fiber laser (1064-1075 nm, 2-10 kHz repetition rate, 1-100 μs pulse width) synchronized with a gated X-ray detector (Pilatus).
- Performed in situ X-ray synchrotron diffraction measurements on samples within a diamond anvil cell up to 60 GPa.
- Employed time-resolved radiometric temperature measurements and finite element calculations.
Main Results:
- Demonstrated microsecond timescale temperature monitoring up to 3000 K with excellent axial and radial temperature uniformity.
- Showcased the ability to fine-tune maximum sample temperature by adjusting laser pulse width.
- Validated the technique through comparison with finite element calculations.
Conclusions:
- The developed pulsed laser heating technique offers a convenient and accurate method for studying materials under extreme conditions.
- This technique facilitates precise measurements of melting curves, phase changes, and thermal equations of state.
- The fine temperature control minimizes chemical reactivity and diffusion, enhancing data reliability.
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