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Updated: Apr 6, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Voltage and Dopant Concentration Measurements of Semiconductors using a Band-Pass Toroidal Energy Analyzer Inside a

Avinash Srinivasan1, Anjam Khursheed1

  • 1Department of Electrical and Computer Engineering,Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR),National University of Singapore,Singapore.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 31, 2015
PubMed

Keywords:
dopant concentrationenergy filtered SE signalssurface microfieldstoroidal energy analyzervoltage measurement

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